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X-Ray Diffraction From Surfaces and Interfaces: Atomic Structure and Morphology

Published online by Cambridge University Press:  25 February 2011

E. Vlieg,
I.K. Robinson and
J.F. van der Veen
E. Vlieg
Affiliation:
FOM-Institute Amolf, Kruislaan 407, 1098 SJ Amsterdam, The NetherlandsAT&T Bell Laboratories, Murray Hill, NJ 07974, USA
I.K. Robinson
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974, USA
J.F. van der Veen
Affiliation:
FOM-Institute Amolf, Kruislaan 407, 1098 SJ Amsterdam, The Netherlands
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Abstract

The emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

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References

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