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59th Denver X-Ray Conference and Selected Papers for the Special June Powder Diffraction issue

Published online by Cambridge University Press:  05 March 2012

Tom Blanton and
George Havrilla
Tom Blanton
Affiliation:
Eastman Kodak Co., Los Alamos National Laboratory
George Havrilla
Affiliation:
Eastman Kodak Co., Los Alamos National Laboratory

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Information

Type
Editorial
Information
Powder Diffraction , Volume 26 , Special Issue 2 , June 2011, pp. 113
Copyright
Copyright © Cambridge University Press 2011

This special June issue of Powder Diffraction is comprised of selected papers presented at the 2010 59th annual Denver X-ray Conference (DXC). At DXC, 16 workshops, 2 poster sessions, and 16 special sessions were held, covering the following topics: Basic XRD, Basic XRF, XRF Sample Prep, Trace Phase Identification, Texture Analysis, 2D Detectors, Cultural Heritage, Quantitative Analysis XRF, Polymers, Pair Distribution Function, Renewable Energy, Polymers-SAXS, Instrumentation, Nanomaterials, Fusion and Industrial Applications XRF, Rietveld Analysis, Handheld XRF, X-ray Imaging, Micro Diffraction, High Resolution XRD, Stress Analysis, and Trace Analysis XRF.

As part of the Denver Conference, proceedings are published and from these proceedings, selected papers covering XRD, XRF, and other high energy scattering methods were chosen for publication in Powder Diffraction. This issue of Powder Diffraction will provide readers with the opportunity to learn about current topics in a variety of materials characterization applications.

The talents of many people are required to make this special issue possible. Besides the authors themselves, we thank the DXC Organizing Committee for their reviews of these articles. We would also like to thank the DXC Conference Coordinator Denise Flaherty, Powder Diffraction Managing Editor Nicole Ernst Boris, and Powder Diffraction Editor-in-Chief Ting Huang for all of their hard work in making this publication a reality. We hope you enjoy this publication and we look forward to seeing you at the 2011 Denver X-ray Conference in Colorado Springs, Colorado 1–5 August 2011 (www.dxcicdd.com).