Hostname: page-component-74656f9884-j7cmm Total loading time: 0 Render date: 2026-11-06T00:37:35.737Z Has data issue: false hasContentIssue false
  • English
  • Français

Computer Comments

Published online by Cambridge University Press:  10 January 2013

Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'

Information

Type
Departments
Information
Powder Diffraction , Volume 1 , Issue 1 , March 1986 , pp. 114 - 118
Copyright
Copyright © Cambridge University Press 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

References

Frevel, L. K., Adams, C. E. and Ruhberg, L. R., J. Appl. Cryst., 9 300 (1976).Google Scholar
Frevel, L. K. and Adams, C. E., Anal. Chem., 40 81335 (1968).Google Scholar
Goehner, R. P. and Garbauskas, M. F., X-Ray Spectrometry, 13 4 (1984).CrossRefGoogle Scholar
Goehner, R. P. and Garbauskas, M. F., Adv. X-Ray Anal., 26 (1983).Google Scholar
Goehner, R. P., GE Technical Information Series, 82CRD114, General Electric, Technical Information Exchange, Schenectady, NY (1982).Google Scholar
Goehner, R. P., Adv. X-Ray Anal., 23 305 (1980).Google Scholar
Johnson, G. G. Jr.,, Norelco Rep., 26 15 (1979).Google Scholar
Johnson, G. G. Jr.,, User Guide Data Base and Search Program, JCPDS, Swarthmore, PA (1975).Google Scholar
Johnson, G. G. Jr., and Vand, V., Ind. Eng. Chem., 59 19 (1967).Google Scholar
Johnson, G. G. Jr.,, Norelco Rep., 26 15 (1979).Google Scholar
Vand, V., and Johnson, G. G. Jr.,, Fortran IV Programs for the Identification of Multiphase Powder Diffraction Patterns Version X, American Society for Testing and Materials (1969).Google Scholar
Johnson, G. G. Jr., and Vand, V., Ind. Eng. Chem., 59 19 (1967).CrossRefGoogle Scholar
Fiala, J., Cesk. Cas. Fyz., 24 237 (1974).Google Scholar
Fiala, J., Hutnicke listy, 32 435 (1977).Google Scholar
Moravcova, H. and Fiala, J., Vestn. Ustred. Ustavu Geol., 55 237 (1980).Google Scholar
Fiala, J., Anal. Chem., 52 1300 (1980).Google Scholar
Fiala, J., Fialova, J., Hutnicke listy, 37 580 (1982).Google Scholar
Fiala, J., Cryst. Res. Technol., 17 643 (1982).CrossRefGoogle Scholar
Fiala, J., Slevarenstvi, 32 35 (1984).Google Scholar
Fiala, J., Computer Physics Communications, 79 85 (1985).Google Scholar
Fiala, J. and Fialova, J., Chemicke listy, 79 48 (1985).Google Scholar
O'Connor, B. H., J. Appl. Cryst., 9 419 (1976).CrossRefGoogle Scholar
O'Connor, B. H., J. Appl. Cryst., 17 121 (1984).Google Scholar
Marquart, R. G. et al. , J. Appl., Cryst., 12, 629, (1979).CrossRefGoogle Scholar
Marquart, R. G., Powder Diffraction 1, 34, (1986).Google Scholar
Johnson, Q., “X-Ray Diffraction Search Match for a Micro-Computer,” Proceedings of the 36th Pittsburgh Conference and Exposition, New Orleans, LA, February 1985.Google Scholar