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Particle statistics and whole-pattern methods in quantitative X-ray powder diffraction analysisa)

Published online by Cambridge University Press:  05 March 2012

Deane K. Smith
Deane K. Smith
Affiliation:
Department of Geosciences, Materials Research Laboratory, The Pennsylvania State University, University Park, Pennsylvania 16802
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Abstract

Modern powder diffraction employing computer-controlled diffractometers now allows quantitative analytical methods to use the whole diffraction trace rather than only individual peaks. Two such methods are in common use: the Rietveld method, which refines the crystal structures of the component phases as part of the matching calculation, and the pattern-fitting method, which uses reference patterns from a database. Potential accuracies of these methods seems to be around 1% absolute. The most severe limitation on the potential accuracy of these methods is particle statistics, which has been reviewed in considerable detail.

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Reprints
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Powder Diffraction , Volume 16 , Issue 4 , December 2001 , pp. 186 - 191
Copyright
Copyright © Cambridge University Press 2001

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