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Powder X-ray diffraction data for potassium silver thiocyanate, AgK(SCN)2 and dipotassium silver thiocyanate, AgK2(SCN)3

Published online by Cambridge University Press:  05 March 2012

Minna Güneş,
Manu Lahtinen and
Jussi Valkonen
Minna Güneş*
Affiliation:
Department of Chemistry, University of Jyväskylä, P.O. Box 35, FIN-40351 Jyväskylä, Finland
Manu Lahtinen
Affiliation:
Department of Chemistry, University of Jyväskylä, P.O. Box 35, FIN-40351 Jyväskylä, Finland
Jussi Valkonen
Affiliation:
Department of Chemistry, University of Jyväskylä, P.O. Box 35, FIN-40351 Jyväskylä, Finland
*
a)Author to whom correspondence should be addressed. Electronic mail: mmlaurik@cc.jyu.fi
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Abstract

Previously unpublished powder X-ray diffraction data for potassium silver thiocyanate, AgK(SCN)2 and dipotassium silver thiocyanate, AgK2(SCN)3 are presented. F30 values for AgK(SCN)2 and AgK2(SCN)3 are 80(0.0075, 50) and 53(0.0089, 63), respectively. The Rietveld refinement of the patterns is also performed. For AgK(SCN)2Rp=6.98, Rwp=11.84, and RBragg=2.9. For AgK2(SCN)3Rp=7.22, Rwp=10.79, and RBragg=5.0.

Keywords

potassium silver thiocyanatedipotassium silver thiocyanatepowder diffraction dataRietveld refinement

Information

Type
New Diffraction Data
Information
Powder Diffraction , Volume 17 , Issue 1 , March 2002, pp. 37 - 40
Copyright
Copyright © Cambridge University Press 2002

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References

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