Hostname: page-component-7b7567c8c-kwt9d Total loading time: 0 Render date: 2026-11-14T07:49:22.412Z Has data issue: false hasContentIssue false
  • English
  • Français

Residual stress determination in surface treated alumina samples applying beam limiting masks

Published online by Cambridge University Press:  06 March 2012

Thorsten Manns,
André Rothkirch and
Berthold Scholtes
Thorsten Manns
Affiliation:
Institute of Materials Engineering, University of Kassel, Germany
André Rothkirch
Affiliation:
HASYLAB at DESY, Germany
Berthold Scholtes
Affiliation:
Institute of Materials Engineering, University of Kassel, Germany
Get access

Abstract

This paper deals with the implementation of a theoretically described method to determine residual stresses in real space directly by means of small gauge volumes. For this purpose, beam limiting masks were designed, manufactured, and investigated in first experiments. Image series taken with a position sensitive CCD camera demonstrate the ability to detect interferences from gauge volumes beneath the sample surface by defined slit geometries. The experiments show that due to the highly absorbing masks the amount of detectable photons is poor, and thus long exposure times are necessary to receive suitable data. For increasing measurement depths (altering masks) a decrease in the intensity can be detected which leads to the assumption that the diffracted photons originate from deeper regions in the material. A model was developed to simulate the diffraction conditions with different mask layouts and material properties. Modeling yields consistent results with experimental data, and thus provides a basis for further improvements of the experimental setup and the realization and assessment of residual stress measurements.

Keywords

residual stress gradientbeam limiting masksaluminareal space methodMAXIM camera

Information

Type
Applications Of Residual Stress Analysis
Information
Powder Diffraction , Volume 24 , Supplement S1 , June 2009, pp. S77 - S81
Copyright
Copyright © Cambridge University Press 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Eigenmann, B. (1992). Röntgenographische Analyse Inhomogener Spannungszustände in Keramiken, Keramik-Metall-Fügeverbindungen und Dünnen Schichten (Universität Karlsruhe, Karlsruhe).Google Scholar
Manns, T., Gibmeier, J., and Scholtes, B. (2006). “Determination of real space residual stress distributions sigma ∼i∼j(z) of surface treated materials with diffraction methods part I: Angle-dispersive approach,” Mater. Sci. ForumMSFOEP 524–525, 31–36.10.4028/www.scientific.net/MSF.524-525.31CrossRefGoogle Scholar
Predecki, P., Ballard, B., and Zhu, X. (1993). “Proposed methods for depth profiling of residual stresses using beam-limiting masks,” Adv. X-Ray Anal.AXRAAA 36, 247–255.Google Scholar
Ruppersberg, H. and Detemple, I. (1993). “Evaluation of the stress field in a ground steel plate from energy-dispersive X-ray diffraction experiments,” Mater. Sci. Eng., AMSAPE3 161, 41–44.10.1016/0921-5093(93)90473-RCrossRefGoogle Scholar
Scholtes, B. (1991). Eigenspannungen in Mechanisch Randschichtverformten Werkstoffzuständen: Ursachen, Ermittlung und Bewertung (DGM Informationsgesellschaft, Oberursel).Google Scholar
Wroblewski, T., Clauß, O., Crostack, H. -A., Ertel, A., Fandrich, F., Genzel, C., Hradil, K., Ternes, W., and Woldt, E. (1999). “A new diffractometer for materials science and imaging at HASYLAB beamline G3,” Nucl. Instrum. Methods Phys. Res. ANIMAER 428, 570–582.10.1016/S0168-9002(99)00144-8CrossRefGoogle Scholar
Zhu, X., Ballard, B., and Predecki, P. (1995). “Determination of Z-profiles of diffraction data from τ-profiles using a numerical linear inversion method,” Adv. X-Ray Anal.AXRAAA 38, 255–262.Google Scholar