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Rietveld analysis of high-density polyethylene

Published online by Cambridge University Press:  10 January 2013

Sampath S. Iyengar  and
Simona Percec
Sampath S. Iyengar
Affiliation:
Analytical Materials Laboratory, P.O. Box 1141, Lompoc, California 93438
Simona Percec
Affiliation:
BP Research and Environmental Science Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
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Abstract

Wide angle X-ray powder diffraction data from unoriented and uniaxially oriented films of high-density polyethylene were analyzed by the Rietveld whole pattern profile fitting technique. A Voigt function was used to model the profile and extract crystallographic information such as the unit cell dimensions, crystallite size and strain, and degree of orientation. The analysis revealed that the technique was efficient in providing not only accurate unit cell dimensions without an internal standard, but also crystallite size and strain information. The oriented films were also successfully modeled with this technique.

Keywords

High-density polyethylenecrystallinitycrystallite sizeorientationX-ray diffraction

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Type
Research Article
Information
Powder Diffraction , Volume 9 , Issue 3 , September 1994 , pp. 217 - 220
Copyright
Copyright © Cambridge University Press 1994

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