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Studies of local and intermediate range structure in crystalline and amorphous materials at high pressure using high-energy X-rays

Published online by Cambridge University Press:  01 March 2012

Lars Ehm
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
Sytle M. Antao
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
Jiuhua Chen
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
Darren R. Locke
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
F. Marc Michel
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
C. David Martin
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
Tony Yu
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
John B. Parise
Affiliation:
Department of Geosciences, Stony Brook University, Stony Brook, New York 11794-2100
Sytle M. Antao
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
Peter L. Lee
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
Peter J. Chupas
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
Sarvjit D. Shastri
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
Quanzhong Guo
Affiliation:
X17B3, National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973-5000
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Abstract

The method of high-energy total elastic X-ray scattering to determine the atomic structure of nanocrystalline, highly disordered, and amorphous materials is presented. The current state of the technique, its potential, and limitations are discussed with two successful studies on the pressure induced phase transition in mackinawite (FeS) and the high-pressure behavior of liquid gallium.

Information

Type
X-Ray Diffraction and Related Techniques
Copyright
Copyright © Cambridge University Press 2007

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