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Towards Improved Alignment of Powder Diffractometers

Published online by Cambridge University Press:  10 January 2013

Walter N. Schreiner
Walter N. Schreiner
Affiliation:
Philips Laboratories, North American Philips Corporation, Briarcliff Manor, New York 10510
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Abstract

An improved method of alignment of a Philips diffractometer equipped with a theta-compensating slit is described. The method employs a special fluorescent screen which is flat to better than 10 microns. The procedure results in accurate alignment of the theta-compensating slit at low angles and assures reliable intensity data down to one degree two theta or less.

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Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 1 , March 1986 , pp. 26 - 33
Copyright
Copyright © Cambridge University Press 1986

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References

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