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Use of X-Ray Powder Diffraction Rietveld Pattern-Fitting for Characterising Preferred Orientation in Gibbsites

Published online by Cambridge University Press:  10 January 2013

Li Deyu,
Brian H. O'Connor,
Gerald I.D. Roach and
John B. Cornell
Li Deyu
Affiliation:
Department of Applied Physics, Curtin University of Technology, GPO U1987, Perth, Western Australia. 6001
Brian H. O'Connor
Affiliation:
Department of Applied Physics, Curtin University of Technology, GPO U1987, Perth, Western Australia. 6001
Gerald I.D. Roach
Affiliation:
Research and Development Department, Alcoa of Australia Limited, Kwinana, Western Australia. 6167
John B. Cornell
Affiliation:
Research and Development Department, Alcoa of Australia Limited, Kwinana, Western Australia. 6167
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Abstract

A study has been conducted with gibbsite specimens, on the use of Rietveld X-ray powder diffraction (XRPD) pattern fitting for quantitating preferred orientation in powders. This study has shown that an earlier formula gives results which correlate closely with an empirical measure of morphology proposed recently for gibbsite powders, viz., the ratio of the XRPD intensities for the (002) line and the (110, 200) doublet lines. A method is proposed on the basis of this correlation for the correction for preferred orientation of line intensities in gibbsite powder patterns. The correction method appears to have excellent potential for XRPD quantification of gibbsite levels in mixtures, and could have general application for coping with preferred orientation effects in the quantitation of other phases.

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Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 2 , June 1990, pp. 79 - 85
Copyright
Copyright © Cambridge University Press 1990

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References

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