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An X-ray diffraction study of poly(ethylene-2,6-naphthalate), PEN

Published online by Cambridge University Press:  05 March 2012

T. N. Blanton
T. N. Blanton*
Affiliation:
Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106
*
a) Electronic mail: thomas.blanton@kodak.com
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Abstract

X-ray diffraction techniques have been applied to study the crystallization of poly(ethylene-2,6-naphthalate), PEN. Uniaxial and biaxial orientation of amorphous cast PEN films resulted in stress-induced crystallization of the triclinic α-PEN polymorph. Annealing of the amorphous PEN samples in the range of 160–240 °C produced thermally induced crystallization of α-PEN. Slow cooling of amorphous PEN from the melt state generated α-PEN as well as the triclinic β-PEN polymorph.

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Type
Technical Articles
Information
Powder Diffraction , Volume 17 , Issue 2 , June 2002 , pp. 125 - 131
Copyright
Copyright © Cambridge University Press 2005

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