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The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction

Published online by Cambridge University Press:  01 March 2012

Udo Welzel  and
Eric J. Mittemeijer
Udo Welzel*
Affiliation:
Max Planck Institute for Metals Research, Heisenbergstrasse 3, D-70569 Stuttgart, Germany
Eric J. Mittemeijer
Affiliation:
Max Planck Institute for Metals Research, Heisenbergstrasse 3, D-70569 Stuttgart, Germany
*
a)Electronic mail: u.welzel@mf.mpg.de
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Abstract

The microstructure of materials is generally, macroscopically, anisotropic and/or inhomogeneous. Traditional diffraction analyses do not take into account this anisotropy and/or inhomogeneity of microstructural features. Thus obtained results can be incomplete, ambiguous, or even erroneous. In this work instrumental requirements (application of parallel beam diffractometers with X-ray lenses or X-ray mirrors and parallel-plate collimators in the laboratory and at synchrotron beam lines) and methodological approaches for the diffraction analysis of anisotropic and inhomogeneous microstructures have been discussed and have been illustrated on the basis of two experimental examples: analysis of the anisotropic nature of the structural imperfection of a sputterdeposited Ti3Al layer and analysis of the anisotropic and inhomogeneous elastic grain interaction in a sputter-deposited Ni layer.

Keywords

microstructureanisotropydiffraction line profile analysistexturestressgrain interactiondepth gradients

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Type
Invited Articles
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Powder Diffraction , Volume 20 , Issue 4 , December 2005 , pp. 376 - 392
Copyright
Copyright © Cambridge University Press 2005

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