Hostname: page-component-7b7567c8c-tnzcf Total loading time: 0 Render date: 2026-11-13T12:42:55.270Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of the CuKβX-Ray Diffraction Pattern of YAG (Yttrium Aluminium Garnet) by Numerical and Computerized Graphics Techniques

Published online by Cambridge University Press:  10 January 2013

G. Berti and
P. Palamidese
G. Berti
Affiliation:
Dipartimento di Scienze della Terra -Universita' di Pisa- Via S. Maria 53, 56100 - Pisa, Italy
P. Palamidese
Affiliation:
Dipartimento di Scienze della Terra -Universita' di Pisa- Via S. Maria 53, 56100 - Pisa, Italy
Get access

Abstract

Yttrium aluminium garnet, Y3A15O12– YAG, has a powder diffraction pattern that is easy to analyse in principle, but shows very interesting problems. These problems are revealed using an interactive graphics system, UNIRAS, intregated with some of the usual procedures for crystallographic data processing. For example, indexing with the APPLEMAN procedure is improved when the high-angle peaks are properly identified, and the cell parameters then refine to a high precision. Iterations between refinements and graphical analysis allows the operator to identify even some of the very weak peaks in the pattern. Using the peak positions from the refinement, the experimental data can be analyzed for instrumental aberrations and corrections can be applied to improve the accuracy of the cell parameter.

Information

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 4 , December 1990, pp. 186 - 191
Copyright
Copyright © Cambridge University Press 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Appleman, D.E., Evans, H.T. Jr.(1973): Job 9214 : Indexing and Least-squares Refinement of Powder Diffraction Data. U.S. Geol. Comp. Centr. 20.Google Scholar
Berti, G., Carrara, R.Leoni, L.(1987). CuKβ X-Ray Powder Diffraction Pattern Resolution Increase. Atti Soc. Tosc. Sc. Nat. Mem 1986. Serie A 93, 57–69.Google Scholar
Bevington, P.R.(1974). Data Reduction and Error Analysis for Physical Science. McGraw Hill.Google Scholar
Geller, S., Espinosa, G.P., Crandall, P.B.(1969). Thermal expansion of Yttrium and Gadolinium Iron Gallium and Aluminium Garnets. J. Appl. Crystallogr. 2, 86.CrossRefGoogle Scholar
International Tables for X-Ray Cryst.Vol. 3 Kynoch Press Birmingham, England 1962page. 162Google Scholar
Keith, M.L.and Roy, R.(1954). Structural Relations among Double Oxides of Trivalent Elements. Am. Min. 39, 1–23.Google Scholar
Klug, H.P., Alexander, L.E.(1974). X-Ray Diffraction Procedure for Polycrystalline and Amorphous Materials. John Wiley and Sons.Google Scholar
Parrish, W., Mack, M.(1963). Data for X-Ray Analysis. Philips Technical Library.Google Scholar
Philips Instruction Manual PW1380/30,9499 300 07211 page 8 Fig. II-1 Rd 1772.Google Scholar
Will, G., Parrish, W., Huang, T.C.(1983). Crystal Structure Refinement by Profile Fitting and Least Squares Analysis of Powder Diffractometer Data. J. Appl. Crystallogr. 16, 611–622.CrossRefGoogle Scholar
Wilson, A.J.C.(1963) Mathematical Theory of X-Ray Powder Diffractometry. Philips Technical Library.Google Scholar