Hostname: page-component-74656f9884-c52kr Total loading time: 0 Render date: 2026-11-08T17:49:05.029Z Has data issue: false hasContentIssue false
  • English
  • Français

Basic principle and performance characteristics of multilayer beam conditioning optics

Published online by Cambridge University Press:  05 March 2012

Licai Jiang ,
Zaid Al-Mosheky  and
Nick Grupido
Licai Jiang
Affiliation:
Osmic, Inc., 1900 Taylor Road, Auburn Hills, Michigan 48326
Zaid Al-Mosheky
Affiliation:
Osmic, Inc., 1900 Taylor Road, Auburn Hills, Michigan 48326
Nick Grupido
Affiliation:
Osmic, Inc., 1900 Taylor Road, Auburn Hills, Michigan 48326
Get access

Abstract

Multilayer optics is one of the widely applied optics for conditioning an X-ray beam in the region of X-ray diffraction. Multilayer optics offers a well-balanced performance. The beam conditioned by a multilayer optic is characterized by low divergence, good spectrum purity, and high intensity. This article will start with a short historical note of the development of X-ray multilayer and a summary on the basic performance characteristics of X-ray multilayer, then move on to the discussion on the design principle of one- and two-dimensional optics. Both parallel beam optics and focusing optics will be addressed. As examples, selected applications of multilayer optics are also briefly discussed. Finally, the main problems associated with the application of multilayer optics are identified and the future developments are discussed.

Keywords

X-ray beam conditioning opticsX-ray multilayer opticsX-ray multilayerX-ray diffraction opticscollimating opticsfocusing optics

Information

Type
New X-Ray Optics
Information
Powder Diffraction , Volume 17 , Issue 2 , June 2002 , pp. 81 - 93
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Du Mond, J.and Youtz, J. P., “X-ray Diffraction from Artificially Stratified Metal Films Deposited by Evaporation,” Phys. Rev. PHRVAO 48, 703 (1935). phr, PHRVAO CrossRefGoogle Scholar
Du Mond, J.and Youtz, J. P., “An X-ray Method of Determining Rates of Diffusion in the Solid State,” J. Appl. Phys. JAPIAU 11, 357 (1940). jap, JAPIAU CrossRefGoogle Scholar
Dinklage, J.and Frerichs, R., “X-ray Diffraction and Diffusion in Metal Film Layered Structures,” J. Appl. Phys. JAPIAU 34, 2633 (1963). jap, JAPIAU CrossRefGoogle Scholar
Dinklage, J., “X-ray Diffraction by Multilayered Thin-Film Structures and Their Diffusion,” J. Appl. Phys. JAPIAU 38, 3781 (1967). jap, JAPIAU CrossRefGoogle Scholar
Blodgett, K. B., “Films Built by Depositing Successive Monomolecular Layers on a Solid Surface,” J. Am. Chem. Soc. JACSAT 57, 1007 (1935). acs, JACSAT CrossRefGoogle Scholar
Blodgett, K. B., “Built-up Films of Barium Stearate and Their Optical Properties,” Phys. Rev. PHRVAO 51, 964 (1937). phr, PHRVAO CrossRefGoogle Scholar
Spiller, E., “Low-Loss Reflection Coating Using Absorbing Materials,” Appl. Phys. Lett. APPLAB 20, 365 (1972). apl, APPLAB CrossRefGoogle Scholar
Spiller, E., “Reflective Multilayer Coating for the Far UV Region,” Appl. Opt. APOPAI 15, 2333 (1976). apo, APOPAI CrossRefGoogle ScholarPubMed
Haelbich, R.and Kunz, C., “Multilayer Interference Mirrors for the XUV Range Around 100 eV Photon Energy,” Opt. Commun. OPCOB8 17, 287 (1976). opc, OPCOB8 CrossRefGoogle Scholar
Barbee, T. W., in Low Energy X-ray Diagnostics, AIP Conference Proceedings APCPCS (American Institute of Physics, New York, 1981), Vol. 75, p. 131. apc, APCPCS Google Scholar
Spiller, E., Segmu¨ller, A., Rife, J., and Haelbich, R. P., “Controlled Fabrication of Multilayer Soft-X-ray Mirrors,” Appl. Phys. Lett. APPLAB 37, 1048 (1980). apl, APPLAB CrossRefGoogle Scholar
Gaponov, S. V., Gusev, S. A., Luskin, B. M., Salaschenko, N. N., and Gluskin, E. S., “Long-Wave X-ray Radion Mirrors,” Opt. Commun. OPCOB8 38, 7 (1981). opc, OPCOB8 CrossRefGoogle Scholar
Underwood, J. H. and Barbee, T. W., “Synthetic Multilayer as Bragg Diffractors for X-rays,” in Low Energy X-ray Diagnostics, AIP Conference Proceedings APCPCS (American Institute of Physics, New York, 1981), Vol. 75, p. 170. apc, APCPCS Google Scholar
Underwood, J. H.and Barbee, T. W., “Layered Synthetic Microstructures as Bragg Diffractors for X-rays and Extreme Ultraviolet: Theory and Predicted Performance,” Appl. Opt. APOPAI 20, 3027 (1981). apo, APOPAI CrossRefGoogle ScholarPubMed
Parratt, L. G., “Surface Studies of Solids by Total Reflection of X-rays,” Phys. Rev. PHRVAO 45, 359 (1954). phr, PHRVAO CrossRefGoogle Scholar
Rosenbluth, A. E.and Lee, P., “Bragg Condition in Absorbing X-ray Multilayers,” Appl. Phys. Lett. APPLAB 40, 466 (1982). apl, APPLAB CrossRefGoogle Scholar
Lee, P., “X-ray Diffraction in Multilayer,” Opt. Commun. OPCOB8 37, 159 (1981). opc, OPCOB8 CrossRefGoogle Scholar
Christensen, F. E., Hornstrup, A., Westergaard, N. J., Schnopper, J., Wood, J., and Parker, K., “A Graded d-spacing Multilayer Telescope for High Energy X-ray Astronomy,” Proc. SPIE PSISDG 1546, 160 (1992). spi, PSISDG CrossRefGoogle Scholar
Verman, B., Kim, B., Wilcox, D., Broadway, D., Platonov, Y., Grupido, N., and Jiang, L., “Graded d-spacing Multilayer Optics for Various Energies,” Adv. X-Ray Anal. AXRAAA 43, 235 (1999). axr, AXRAAA Google Scholar
Schuster, M.and Gobel, H., “Application of Graded Multilayer Optics for X-ray Diffraction,” Adv. X-Ray Anal. AXRAAA 39, 57 (1995). axr, AXRAAA Google Scholar
Kirkpatrick, P.and Baez, A. V., “Formation of Optical Images by X-rays,” J. Opt. Soc. Am. JOSAAH 38, 766 (1948). jox, JOSAAH CrossRefGoogle ScholarPubMed
Montel, M., “The X-ray Microscope with Catamegonic Roof-Shaped Objective,” in X-ray Microscope and Microradiography (Elsevier, Amsterdam, 1953), p. 177.Google Scholar
Thathachari, Y. T., “Theory of Image Formation in Combination of X-ray Focusing Mirrors,” Proc. Indian Acad. Sci. A PISAA7 37, 41 (1953). pid, PISAAT CrossRefGoogle Scholar
Misture, S. T., Zdzieszynski, S., and Smith, R. “Evaluation of Parallel Beam Multilayer Optics for Powder Diffractometers,” in 47th Annual Denver X-ray Conference, Colorado Springs, August 3–7, 1998, Abstracts, p. 152.Google Scholar
Holz, T., Dietsch, R., Mai, H., and Brugemann, L., “Application of Ni/C Mirrors as parallel Beam X-ray Optics for Cu Kα and Mo Kα Radiation,” Adv. X-Ray Anal. AXRAAA 43, 212 (1999). axr, AXRAAA Google Scholar
Michaelsen, C., Ricardo, P., Anders, D., Schuster, M., Schilling, J., and Göbel, H., “Improved Multilayer Optics and XRD applications,” Adv. X-Ray Anal. AXRAAA 42, 308 (1998). axr, AXRAAA Google Scholar
Yang, C., Courville, A., and Ferrara, J. D., “Optics System for the Home Laboratory: Caveat emptor,” Acta Crystallogr., Sect. D: Biol. Crystallogr. ABCRE6 D55, 1681 (1999). abd, ABCRE6 CrossRefGoogle Scholar
Jiang, L., Verman, B., and Joensen, K. D., “A General Approach in Multilayer Optical System Design for SAXS,” J. Appl. Crystallogr. JACGAR 33, 801 (2000). acr, JACGAR CrossRefGoogle Scholar
Verman, B., Kim, B., Jiang, L., Yang, C., Courville, A., Stence, C. N., Ferrara, J. D., Harada, J., Kuribayashi, M., Omote, K., and Yamano, A., “Experimental Study of Microfocus Generator Coupled to a Confocal Max-Flux Optics for Protein Crystallography,” ACA Meeting, St. Paul, MN, 22–27 July 2000.Google Scholar
Jiang, L., Verman, B., Seshadri, S., Kim, B., Concolino, T. E., Courville, A., and Ferrara, J. D., “Improved Performance of Small Molecule Diffractometer by Using Microfocusing Source Based Multilayer Mirror System,” ACA Conference, Los Angeles, 21–26 July 2001.Google Scholar