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Characterization of standard reference materials for obtaining instrumental line profiles

Published online by Cambridge University Press:  10 January 2013

Matteo Leoni,
Paolo Scardi and
J. Ian Langford
Matteo Leoni
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, via Mesiano, 77, 38050 Trento, Italy
Paolo Scardi
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, via Mesiano, 77, 38050 Trento, Italy
J. Ian Langford
Affiliation:
School of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, UK
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Abstract

Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.

Keywords

standard reference materials (SRMs)line-profile analysissample transparencysynchrotron radiation

Information

Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 4 , December 1998, pp. 210 - 215
Copyright
Copyright © Cambridge University Press 1998

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References

Caglioti, G., Paoletti, A., and Ricci, F. P. (1958). “Choice of collimators for a crystal spectrometer for neutron diffraction,” Nucl. Instrum. Methods 3, 223–228.CrossRefGoogle Scholar
Cernik, R. J., Murray, P. K., Pattison, P., and Fitch, A. N. (1990). “A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system,” J. Appl. Crystallogr. 23, 292–296.CrossRefGoogle Scholar
Enzo, S., Fagherazzi, G., Benedetti, A., and Polizzi, S. (1988). “A profile fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology,” J. Appl. Crystallogr. 21, 536–542.CrossRefGoogle Scholar
Fawcett, T. G., Crowder, C. E., Brownell, S. J., Zhang, Y., Hubbard, C., Schreiner, W., Hamill, G. P., Huang, T. C., Sabino, E., Langford, J. I., Hamilton, R., and Louër, D. (1988). “Establishing an instrumental peak profile calibration standard for powder diffraction: International round robin conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards,” Powder Diffr. 3, 209–218.CrossRefGoogle Scholar
Hart, M., Cernik, R. J., Parrish, W., and Toraya, H. (1990). “Lattice-parameter determination for powders using synchrotron radiation,” J. Appl. Crystallogr. 23, 286–291.CrossRefGoogle Scholar
Langford, J. I. (1987). “Some applications of pattern fitting to powder diffraction data,” Prog. Cryst. Growth Charact. 14, 185–211.CrossRefGoogle Scholar
Langford, J. I., and Louër, D. (1996). “Powder diffraction,” Rep. Prog. Phys. 59, 131–234.CrossRefGoogle Scholar
Langford, J. I., and Wilson, A. J. C. (1962). “Counter diffractometer: The effects of specimen transparency on the intensity, position and breadth of X-ray powder diffraction lines,” J. Sci. Instrum. 39, 581–585.CrossRefGoogle Scholar
Louër, D., and Audebrand, N. (1988). “Profile fitting and diffraction line-broadening analysis,” Adv. X-Ray Anal. 41,.Google Scholar
Louër, D., and Langford, J. I. (1988). “Peak shape and resolution in conventional diffractometry with monochromatic X-rays,” J. Appl. Crystallogr. 21, 430–437.CrossRefGoogle Scholar
Parrish, W., Hart, M., Erickson, C. G., Masciocchi, N., and Huang, T. C. (1986). “Instrumentation for synchrotron X-ray powder diffractometry,” Adv. X-Ray Anal. 29, 243–250.Google Scholar
Reefman, D. (1996). “Effects of sample transparency in powder diffraction,” Powder Diffr. 11, 107–113.CrossRefGoogle Scholar
Scardi, P. (1995), “XRD line broadening and texture of thin films,” in Science and Technology of Thin Films, edited by F. C. Matacotta and G. Ottaviani (World Scientific, Singapore), pp. 241–278.CrossRefGoogle Scholar
Scardi, P., Leoni, M., Cappuccio, G., Langford, J. I., and Cernik, R. J. (1996). “The breadth and shape of instrumental line profiles for the powder diffraction station 2.3 at the Daresbury Laboratory SRS,” Mater. Sci. Forum 228–231, 207–212.CrossRefGoogle Scholar
Scardi, P., Lutterotti, L., and Maistrelli, P. (1994). “Experimental determination of the instrumental broadening in the Bragg-Brentano geometry,” Powder Diffr. 9, 180–186.CrossRefGoogle Scholar
van Berkum, J. G. M., Sprong, G. J. M., de Keijser, Th. H., Delhez, R., and Sonneveld, E. J. (1995). “The optimum standard specimen for X-ray diffraction line-profile analysis,” Powder Diffr. 10, 129–139.CrossRefGoogle Scholar