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Chemical analysis by diffraction: the Powder Diffraction File™

Published online by Cambridge University Press:  20 June 2017

T. G. Fawcett
Affiliation:
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, Pennsylvania 19073
S. N. Kabekkodu
Affiliation:
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, Pennsylvania 19073
J. R. Blanton
Affiliation:
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, Pennsylvania 19073
T. N. Blanton
Affiliation:
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, Pennsylvania 19073

Abstract

As we celebrate the 75th anniversary of the Powder Diffraction File, the PDF® is still a method for chemical and material analyses. The database and embedded software are designed to solve a range of solid-state material analysis problems that includes phase identification, quantitative analysis, crystallinity, and crystallite size measurements. A versatile platform allows users to interpret X-ray, electron, neutron, or synchrotron diffraction patterns for their analyses. Over several decades as diffraction hardware and software continued to improve, the International Centre for Diffraction Data continues to improve the methods and the PDF database, offering unprecedented analysis capabilities to the modern user.

Information

Type
Review Article
Copyright
Copyright © International Centre for Diffraction Data® 2017 
Figure 0

Figure 1. (Color online) Growth of the Powder Diffraction File, PDF-4+ (red) and PDF-4/Organics (green)

Figure 1

Figure 2. (Color online) The growth of the Powder Diffraction File 2004–2016, both in database size (GBytes, orange and dark blue lines), content and capability (searches in green, display fields in purple).

Figure 2

Table I. Comparison of general features in the 1941, 1983, and 2016 PDF databases.

Figure 3

Figure 3. (Color online) Six dimensional indexing and simulated powder pattern of bismuth chromium oxide (PDF 05-001-0336), a material containing both atomic displacement and occupancy modulations.

Figure 4

Table II. Select subfile populations in PDF products. The subfiles outlined in a box are the largest known crystallographic compilations of these materials.

Figure 5

Table III. Quality marks and symbols used by the PDF to evaluate and classify different types of data.

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Figure 4. (Color online) Electron diffraction analysis module contained in the PDF-4 databases. Top figure demonstrates from the left; nanomaterial, ring, and spot pattern reference simulations. The bottom figure shows experimental data that is overlaid with a reference simulation to identify the material and its crystallographic orientation.

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Figure 5. (Color online) Identification of materials from a constant wavelength neutron diffraction experiment (top) and a synchrotron diffraction experiment (bottom). Each module has an ability to import experimental data and match it to reference data that has been modified for instrument type, detector (1D or 2D), wavelength, and radiation type.