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The direct determination of X-ray diffraction data from specific depths

Published online by Cambridge University Press:  01 March 2012

A. Broadhurst ,
K. D. Rogers ,
D. W. Lane  and
T. W. Lowe
A. Broadhurst
Affiliation:
Centre for Materials Science and Engineering, Cranfield University, RMCS, Shrivenham, Swindon, Wilts SN6 8LA, United Kingdom
K. D. Rogers
Affiliation:
Centre for Materials Science and Engineering, Cranfield University, RMCS, Shrivenham, Swindon, Wilts SN6 8LA, United Kingdom
D. W. Lane
Affiliation:
Centre for Materials Science and Engineering, Cranfield University, RMCS, Shrivenham, Swindon, Wilts SN6 8LA, United Kingdom
T. W. Lowe
Affiliation:
Applied Mathematics and Operational Research Group, Cranfield University, RMCS, Shrivenham, Swindon, Wilts SN6 8LA, United Kingdom
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Abstract

A direct method for determining powder diffraction data from a range of depths is described, where the linear absorption coefficient may vary with depth. A series of traditional data collections with varying angles of incidence are required, and the X-ray diffraction data arising from specific depths will be calculated by the transformation of these measured, angle-dependent spectra. These may then be analysed using any conventional method in order to gain information about characteristics of the sample in question at specific depths. Regularisation techniques have been used to solve the governing Fredholm integral equation to determine the depth-dependent diffractograms. The method has been validated by the use of simulated data having known model profiles, and has also been applied to experimental data from polycrystalline thin film samples.

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Type
Technical Articles
Information
Powder Diffraction , Volume 20 , Issue 3 , September 2005 , pp. 233 - 240
Copyright
Copyright © Cambridge University Press 2005

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