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Enhancement of XRF intensity by using Au-coated glass monocapillary

Published online by Cambridge University Press:  05 March 2012

Takashi Nakazawa,
Kazuhiko Nakano,
Masaru Yoshida and
Kouichi Tsuji
Takashi Nakazawa*
Affiliation:
Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan
Kazuhiko Nakano
Affiliation:
Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan
Masaru Yoshida
Affiliation:
Adachi New Industrial Co., Ltd., 1-14-20 Hori Tachiuri, Nishi-ku, Osaka 550-0012, Japan
Kouichi Tsuji
Affiliation:
Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: nakazawa@a-chem.eng.osaka-cu.ac.jp
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Abstract

Results on using X-ray optics with a monocapillary attached to a microfocus Mo X-ray tube for a high-intensity XRF analysis are reported. Au-coated glass monocapillaries with 400 and 700 μm inner diameters were used to obtain focused and intensive incident Mo X-rays for the measurements of XRF intensities from pure metal samples. Intensity enhancements obtained by using the Au-coated monocapillaries were found to be up to 1.5 times higher than those obtained by using similar inner diameter uncoated glass capillaries. The XRF intensity profiles were measured by the wire scanning method to investigate the reasons. The traces of the incident X-rays were calculated by taking into account of X-ray total reflection of the incident X-rays from the inner wall of the capillaries. The calculated XRF intensity profiles agree with those of the measured XRF intensity profiles. The observed enhancements in XRF intensity were the results of the incident X-rays emitted from the Mo X-ray tube being totally reflected on the inner wall of the Au-coated monocapillaries.

Keywords

micro-XRFAu-coated glass monocapillaryX-ray total reflection

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Type
Technical Articles
Information
Powder Diffraction , Volume 26 , Special Issue 2 , June 2011, pp. 163 - 167
Copyright
Copyright © Cambridge University Press 2011

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