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Evaluation of expandability for randomly interstratified illite/smectite using interstratificational peak broadening

Published online by Cambridge University Press:  01 March 2012

Il Mo Kang ,
Myung Hun Kim ,
Youn Joong Kim ,
Hi-Soo Moon  and
Yungoo Song
Il Mo Kang
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Myung Hun Kim
Affiliation:
Department of Chemistry, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Youn Joong Kim
Affiliation:
Division of Nano-Material and Environmental Science, Korea Basic Science Institute, Taejon, 305-333, Korea
Hi-Soo Moon*
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Yungoo Song
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
*
a)Author to whom correspondence should be addressed. Electronic mail: hsmoon@yonsei.ac.kr
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Abstract

This study attempted to quantify the interstratificational broadening of the randomly interstratified illite/smectite (random I∕S) basal reflection and to evaluate the percentage of the interstratified illite layers (%I) from the result. The interstratificational broadening was quantified using the distributional discrepancy (D) defined as D=[∑t∣ft(obs)−ft(ref)∣]∕2, where ft(obs) is the frequency of a crystallite containing thickness, t (the number of layers), measured from a basal reflection broadened by interstratifications, and ft(ref) is the frequency for a basal reflection with no interstratificational broadening. The basal reflections at 5.2° 2θ under glycolation and 8.84° 2θ under thermal dehydration provided the ft(obs) and ft(ref) of random I∕S. The linear relation, D=2.17%I+2.49(0⩽%I⩽30), was obtained from simulations for SWy-2 (Wyoming, USA).

Keywords

smectiteilliteI∕Sinterstratificationspeak broadeningcrystallite thickness

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Type
Technical Articles
Information
Powder Diffraction , Volume 20 , Issue 3 , September 2005 , pp. 230 - 232
Copyright
Copyright © Cambridge University Press 2005

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References

Drits, V. A., Eberl, D. D., and Środoń, J. (1998). “XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallites by Bertaut-Warren-Averbach technique,” Clays Clay Miner.CLCMAB 46, 38–50.CrossRefGoogle Scholar
Drits, V. A., Varaxina, T. V., Sakharov, B. A., and Plançon, A. (1994). “A simple technique for identification of one-dimensional powder X-ray diffraction patterns for mixed-layer illite-smectites and other interstratified minerals,” Clays Clay Miner.CLCMAB 42, 382–390.CrossRefGoogle Scholar
Eberl, D. D., Drits, V., Środoń, J., and Nüesch, R. (1996). “MudMaster, a program for calculating crystallite size distributions and strain from the shapes of X-ray diffraction peaks,” U. S. Geological Survey, Open File Report 96-171.Google Scholar
Elzea, J. and Murray, H. H. (1994). “Bentonite,” in Industrial Minerals and Rocks, 6th ed., edited by Carr, D. D. (Society for Mining, Metallurgy, and Exploration, Inc., CO), pp. 233–246.Google Scholar
Inoue, A., Bouchet, A., Velde, B., and Meunier, A. (1989). “Convenient technique for estimating smectite layer percentage in randomly interstratified illite/smectite minerals,” Clays Clay Miner.CLCMAB 37, 227–234.CrossRefGoogle Scholar
Kang, I. M., Moon, H. S., Song, Y., and Kim, M. H. (2004). “Equations for quantifying Fe and K within the illite structure using X-ray powder diffraction,” Powder Diffr.PODIE210.1154/1.1775229 19, 247–248.CrossRefGoogle Scholar
Moore, D. M. and Reynolds, R. C. (1997). X-ray Diffraction and the Identification and Analysis of Clay Minerals (Oxford University Press, Oxford), 2nd ed., 378 pp.Google Scholar
Mystkowski, K., Środoń, J., and Elsass, F. (2000). “Mean thickness and thickness distribution of smectite crystallites,” Clay Miner.CLMIAF 35, 545–557.CrossRefGoogle Scholar
Reynolds, R. C. (1980). “Interstratified clay minerals,” in Crystal Structures of Clay Minerals and their X-ray Identification, edited by Brindley, G. W. and Brown, G. (Mineralogical Society, London), pp. 249–303.CrossRefGoogle Scholar
Reynolds, R. C. and Reynolds, R. C. (1996). “NEWMOD© for Windows, a computer program for the calculation of one-dimensional X-ray diffraction patterns of mixed-layered clay minerals,” published by the authors, 8 Brook Road, Hanover, NH.Google Scholar
Sato, T., Watanabe, T., and Otsuka, T. (1992). “Effects of layer charge, charge location and energy change on expansion properties of dioctahedral smectites,” Clays Clay Miner.CLCMAB 40, 103–113.CrossRefGoogle Scholar
Środoń, J. (1981). “X-ray identification of randomly interstratified illite-smectites in mixtures with discrete illite,” Clay Miner.CLMIAF 16, 297–304.CrossRefGoogle Scholar
Środoń, J., Elsass, F., McHardy, W. J., and Morgan, D. J. (1992). “Chemistry of illitesmectite inferred from TEM measurements of fundamental particles,” Clay Miner.CLMIAF 27, 137–158.CrossRefGoogle Scholar
Tettenhorst, R. and Reynolds, R. C. Jr. (1971). “Choice of origin and its effect on calculated X-ray spacings for thin montmorillonite crystals,” Am. Mineral.AMMIAY 56, 1477–1480.Google Scholar
Tomita, K., Takahashi, H., and Watanabe, T. (1988). “Quantification curves for mica/smectite interstratifications by X-ray powder diffraction,” Clays Clay Miner.CLCMAB 36, 258-262.CrossRefGoogle Scholar
Watanabe, T. (1988). “The structural model of illite/smectite interstratified mineral and the diagram for its identification,” Clay Sci. 7, 97–114.Google Scholar
Wilson, A. J. C. (1949). X-ray Optics (Methuen, London), 127 pp.Google Scholar