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Geometrical factors for correction of intensities in Seemann–Bohlin diffractometry

Published online by Cambridge University Press:  10 January 2013

R. Černý and
V. Kupčík
R. Černý
Affiliation:
Faculty of Mathematics-Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czechoslovakia
V. Kupčík
Affiliation:
Institute of Mineralogy and Crystallography, University of Göttingen, V. M. Goldschmidt-str. 1, 3400 Göttingen, Germany
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Abstract

The correct formulas for geometrical factors for correction of diffracted intensities in Seemann-Bohlin diffractometry were tested. A Huber 653 goniometer, gold and titanium nitride layers, white tin, and rutile as specimens were used in the reflection mode. A Huber 642 goniometer and olivine as a specimen were used in the transmission mode. It was found that, due to a variable specimen-detector distance during 2θ scan, the variable efficiency of the Soller slits in the diffracted beam must be taken into account. The model describing this effect analytically is presented. As a final test the structures of white tin, rutile, and olivine were refined from the measured data corrected for different factors.

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Type
Research Article
Information
Powder Diffraction , Volume 8 , Issue 1 , March 1993, pp. 7 - 13
Copyright
Copyright © Cambridge University Press 1993

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References

Azaroff, L. V. (1955). Acta Cryst. 8, 701.Google Scholar
Bohlin, H. (1920). Ann. Phys. 61, 420.Google Scholar
Busing, W. R., and Levi, H. A. (1959). ORNL Rep. 59-4-37, Oak Ridge National Laboratory, Oak Ridge, TN.Google Scholar
Gillham, C. J., and King, H. W. (1972). J. Appl. Cryst. 5, 23.Google Scholar
Haegg, G. (1947). Rev. Sci. Instr. 18, 371.CrossRefGoogle Scholar
Hanke, K. (1965). Beitr. Mineral. Petrog. 11, 535.Google Scholar
Jeffrey, G. A. (1981). AIP 50th Anniversary Physics Vade Mecum, American Institute of Physics, New York.Google Scholar
von Kunze, G. (1964). Z. Anorg. Phys. 17, 412,522; 18, 28.Google Scholar
Kupčík, V., Cerný, R., and Steins, M. (1990). Proceedings of the International Conference on Powder Diffraction, Toulouse 16–19, July 1990 (International Union of Crystallography, City), p. 23.Google Scholar
McKie, D., and McKie, Ch. (1986). Essentials of Crystallography (Black-well, Oxford).Google Scholar
Neff, H. (1962). Grundlagen und Anwendung der Röntgen-Feinstruktur Analyse (Oldenbourg, München).Google Scholar
Parrish, W., and Mack, M. (1967). Acta Cryst. 23, 687.Google Scholar
Pawley, G. S. (1981). J. Appl. Cryst. 14, 357.Google Scholar
Pike, E. R. (1957). J. Sci. Instr. 34, 355.CrossRefGoogle Scholar
Seemann, H. (1919). Ann. Phys. 59, 455.Google Scholar
Stoecker, W. C., and Starbuck, J. W. (1965). Rev. Sci. Instr. 36, 1593.Google Scholar
Valvoda, V., Cerný, R., Kužel, R. Jr., Dobiasova, L. (1987). Cryst. Res. Tech. 22, 1301.Google Scholar
Villars, P., and Calvert, L. D. (1986). Pearson's Handbook of Crystallographic Data for Intermetallic Phases (American Society for Metals, Metals Park, USA), Vols. 1–3.Google Scholar
Wassermann, G., and Wiewiorosky, J. (1953). Z. Metallk. 44, 567.Google Scholar