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Latest developments in microtomography and nanotomography at PETRA III

Published online by Cambridge University Press:  29 February 2012

A. Haibel,
F. Beckmann,
T. Dose,
J. Herzen,
M. Ogurreck,
M. Müller and
A. Schreyer
A. Haibel*
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
F. Beckmann
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
T. Dose
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
J. Herzen
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
M. Ogurreck
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
M. Müller
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
A. Schreyer
Affiliation:
GKSS Research Centre Geesthacht, Geesthacht, Germany
*
a)GKSS Research Centre Geesthacht, Max-Planck-Str. 1, D-21502 Geesthacht, Germany. Electronic mail: astrid.haibel@gkss.de
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Abstract

Due to the extraordinary beam characteristics of the new PETRA III synchrotron, i.e., the high brilliance, the extremely low emittance of 1 nm rad, and the high fraction of coherent photons even in the hard X-ray range, the imaging beamline (IBL) at PETRA III will provide state of the art imaging and tomography capabilities with resolution well into the nanometer range. Novel applications of tomographic techniques allow for high speed in situ measurements as well as highest spatial and density resolutions. Additionally, the highly coherent beam enables the application of phase contrast methods in an exceptional way. Since the focus is on the energy range between 5 and 50 keV, the IBL will among others be ideally suited for microtomography and nanotomography on small engineering materials science samples as well as for studying soft matter, bones, medical implants, and biomatter.

Keywords

synchrotron tomographyimagingmicrotomographynanotomography

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Type
Technical Articles
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010, pp. 161 - 164
Copyright
Copyright © Cambridge University Press 2010

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