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Lattice deformation measurements via “on site X-ray diffraction”
Published online by Cambridge University Press: 14 November 2013
Abstract
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The present paper is about the estimation of lattice deformation from data collected from manufactures directly on site. The aim here is to give evidence that the concept of the Mean Equivalent Lattice (MEL), when applied to “on site X-Ray Diffraction” is the basis for a reliable qualification of the material rheology to external solicitations. Such method allows for the identification of lattice deformations without resorting to the computation of the residual stress with using the elasticity constants (i.e. tensile, shear and rigidity constants E, μ, ν); these elasticity constants descend from the classical theory of solid mechanics, where the continuum mechanics and the material isotropic model are the fundaments. Any MEL deformation is instead related to the variation of the d-spacing among lattice planes which are connected to the anisotropic atomic arrangement. So the macroscopic scale is constituted by a number of MELs and related boundaries. The recent on site X-ray diffraction technology may offer effective and easy solutions, with a significant impact on reliability of results, simplification, economy and time consuming.
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- Copyright © International Centre for Diffraction Data 2013
References
Berti, G. (2007). “Diffractometer and Method for diffraction analysis,” US patent 7,260,178.Google Scholar
Berti, G. (2001), “A method for routine comparison of XRPD measurements,” Powder Diffr., 16, 1–6.Google Scholar
Berti, G. (1995). “Detection and modelling of micro-crystallinity by means of X-ray Powder Diffractometry,” Adv. X.Ray Anal., 38, 415–412.Google Scholar
Berti, G. and De Marco, F. (2010). “Fractional nanophotonics: On site NDT-XRD for Cultural Heritage and Environment,” Proceedings Convegno Nazionale sulle tecnologie fotoniche,” Pisa – Italy, 25-27.Google Scholar
Berti, G., De Marco, F. and Nicoletta, A. (2008). “On site X.ray diffraction from distance for cultural heritage,” in In situ monitoring of monumental surfaces- Proceedings of the International Workshop SM08 27-29 October 2008, edited by Edifir, Florence, pp. 409–414.Google Scholar
Caglioti, G. (1974), Introduzione alla fisica dei materiali (Zanichelli, Bologna, Italy).Google Scholar
Hosemann, R. and Bagchi, S. N. (1962). Direct Analysis of Diffraction by matter (North-Holland Pub. Co., Amsterdam).Google Scholar
Parrish, W. and Mack, M. (1963). Data for X-Ray Analysis (Eindhoven, N. V. Philips' Gloeilampenfabrieken).Google Scholar
prEN13925-4: “Non-destructive testing- X-ray diffraction from polycrystalline and amorphous materials- Part4: Reference Materials” – This label is still related to the WG10 of CEN/TC138 - Doc. 18 rev 5 still under study.Google Scholar
UNI-EN 15305 (2008). “Non-destructive Testing – Test Method for Residual Stress analysis by X-ray Diffraction,” CEN - AFNOR Paris. [http://store.uni.com/magento-1.4.0.1/] [accessed 12-Aug-2013].Google Scholar
UNI-EN 13925-3 (2005). “Non-destructive testing- X-ray diffraction from polycrystalline and amorphous materials- Part 3: Instruments,” – CEN - AFNOR Paris. [http://store.uni.com/magento-1.4.0.1/] accessed 12-Aug-2013.Google Scholar
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