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Monte Carlo simulation of projections in computed tomography

Published online by Cambridge University Press:  29 February 2012

B. Chyba,
M. Mantler and
M. Reiter
B. Chyba
Affiliation:
Vienna University of Technology, Vienna, Austria
M. Mantler*
Affiliation:
Vienna University of Technology, Vienna, Austria
M. Reiter
Affiliation:
Upper Austria University of Applied Sciences, Wels, Austria
*
a)Author to whom correspondence should be addressed. Electronic mail: michael.mantler@ifp.tuwien.ac.at
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Abstract

Results from Monte Carlo simulations of two-dimensional projections for a simple real sample (an aluminium cube with a cylindrical hole filled by air or steel) in a realistic experimental environment are presented. A meaningful comparison with measurements was therefore possible. Coherent and incoherent scattering as well as excitation of fluorescent radiation are accounted for; multiple sequences of these interactions are followed up to a selectable order. Such simulations are important aids to modern metrological applications of computed tomography where the dimensional accuracy of hidden or inaccessible components of work pieces is determined. The complex process requires a high level of optimization of the instrumental parameters for each sample type whereby the accurate simulation of the physical interactions between X-rays and the sample material is a supplement and alternative to time consuming measurements.

Keywords

Monte Carlo simulationcomputed tomographyindustrial metrologyfundamental parameters

Information

Type
X-Ray Fluorescence
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008, pp. 150 - 153
Copyright
Copyright © Cambridge University Press 2008

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