Hostname: page-component-7b7567c8c-fvjsw Total loading time: 0 Render date: 2026-11-15T13:05:09.279Z Has data issue: false hasContentIssue false
  • English
  • Français

On the microstructure of a high-pressure phase of W3O8

Published online by Cambridge University Press:  10 January 2013

D. Louër,
M. Sundberg,
P.-E. Werner,
V. P. Filonenko and
I. P. Zibrov
D. Louër
Affiliation:
Laboratoire de Cristallochimie, CSIM (URA CNRS 1495)Université de Rennes I, Avenue du Général Leclerc, 35042 Rennes Cedex, France
M. Sundberg
Affiliation:
Department of Inorganic and Structural Chemistry, Arrhenius Laboratory, Stockholm University, S-106 91 Stockholm, Sweden
P.-E. Werner
Affiliation:
Department of Inorganic and Structural Chemistry, Arrhenius Laboratory, Stockholm University, S-106 91 Stockholm, Sweden
V. P. Filonenko
Affiliation:
Institute of High-Pressure Physics, Academy of Sciences of Russia, Troitsk, Moscow Region, Russia
I. P. Zibrov
Affiliation:
Institute of Crystallography, Academy of Sciences of Russia, Leninsky prosp, 59, Moscow 117 333, Russia
Get access

Abstract

The structures of two high-pressure tungsten oxides, previously studied by high-resolution electron microscopy, were confirmed by Rietveld refinement based on X-ray powder diffraction data. The phases have identical stoichiometry, W3O8, and extremely narrow 00l reflections in common. The microstructure of the dominant phase was investigated by means of X-ray powder diffraction pattern decomposition. A Williamson–Hall plot revealed that all lines, except the 00l reflections, were broadened solely due to the crystallite size effect. A cylindrical model is used to describe the average form of the coherently diffracting domains. The height of the cylinder, whose axis is colinear with the crystallographic c parameter of both phases, is considered “infinite,” and the average diameter of the cylinder model is 655(22) Å. A quantitative confirmation is obtained from electron microscopy.

Information

Type
Research Article
Information
Powder Diffraction , Volume 10 , Issue 2 , June 1995, pp. 81 - 85
Copyright
Copyright © Cambridge University Press 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Göbel, H. E. (1979). “A new method for fast XRPD using a position sensitive detector,” Adv. X-Ray Anal. 22, 255–265.Google Scholar
Langford, J. I. (1978). “A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function,” J. Appl. Cryst. 11, 10–14.CrossRefGoogle Scholar
Langford, J. I., Boultif, A., Auffrédic, J. P., and Louër, D. (1993). “The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide,” J. Appl. Cryst. 26, 22–33.CrossRefGoogle Scholar
Langford, J. I., and Louër, D. (1982). “Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites,” J. Appl. Cryst. 15, 20–26.CrossRefGoogle Scholar
Louër, D. (1994). “Applications of profile analysis for micro-crystalline properties from total pattern fitting,” Adv. X-ray Anal. 37, in press.Google Scholar
Louër, D., Auffrédic, J. P., Langford, J. I., Ciosmak, D., and Niepce, J. C. (1983). “A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis,” J. Appl. Cryst. 16, 183–191CrossRefGoogle Scholar
Louër, D., and Langford, J. I. (1988). “Peak shape and resolution in conventional diffractometry with monochromatic X-rays,” J. Appl. Cryst. 21, 430–437.CrossRefGoogle Scholar
Sundberg, M., Zakharov, N. D., Zibrov, I. P.Barabanenkov, Y. A., Filonenko, V. P., and Werner, P. (1993). “Two high-pressure tungsten oxide structures of W3O8 stoichiometry deduced from high-resolution electron microscopy images,” Acta Cryst. B 49, 951–958.CrossRefGoogle Scholar
Toraya, H. (1989). “The determination of direction-dependent crystallite size and strain by X-ray whole-powder-pattern fitting,” Powder Diffr. 4, 130–136.CrossRefGoogle Scholar
Williamson, G. K., and Hall, W. H. (1953). “X- ray line broadening from filed aluminium and wolfram,” Acta Metall. 1, 22–31.CrossRefGoogle Scholar