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Preconcentration of environmental waters by agar for XRF analysis

Published online by Cambridge University Press:  20 May 2016

Kazuhiko Nakano ,
Kenta Okubo  and
Kouichi Tsuji
Kazuhiko Nakano*
Affiliation:
Department of Applied Chemistry, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan. JST-Innovation Plaza Osaka, 3-1-10 Technostage, Izumi-city, Osaka 594-1144, Japan
Kenta Okubo
Affiliation:
Department of Applied Chemistry, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan
Kouichi Tsuji*
Affiliation:
Department of Applied Chemistry, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan
*
a)Electronic mail: nakano@a-chem.eng.osaka-cu.ac.jp
b)Electronic mail: tsuji@a-chem.eng.osaka-cu.ac.jp
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Abstract

We have developed a convenient and effective XRF analysis procedure for trace amount of K, Ca, V, Mn, Fe, Ni, Cu, Zn, Cd, and Pb in environmental waters by using a preconcentration using the natural polymer (agar). The thin agar film was prepared by drying a homogeneous agar gel after mixing the aqueous sample solution with the agar powder. XRF analysis of the preconcentrated thin agar films containing trace metals showed a good repeatability because agar films were homogeneous enough. SB (signal to noise) ratios of the XRF intensity of the analytes were improved drastically. The linear calibration curves of K, Ca, V, Mn, Fe, Ni, Cu, Zn, Cd, and Pb showed a good linearity within the calibration ranges. The lower limits of detection (LLD) were 1.4 μg/mL for K, 0.26 μg/mL for Ca, 0.088 μg/mL for V, 0.029 μg/mL for Mn, 0.11 μg/mL for Fe, 0.016 μg/mL for Ni, 0.030 μg/mL for Cu, 0.017 μg/mL for Zn, 0.20 μg/mL for Cd, and 0.066 μg/mL for Pb, respectively. The proposed preconcentration method was applied to several environmental water samples.

Keywords

XRF analysispreconcentrationenvironmental wateragar

Information

Type
X-Ray Fluorescence
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 135 - 139
Copyright
Copyright © Cambridge University Press 2009

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