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The Reference Intensity Ratio: Its Measurement and Significance

Published online by Cambridge University Press:  10 January 2013

Briant L. Davis ,
Randy Kath  and
Michael Spilde
Briant L. Davis
Affiliation:
South Dakota School of Mines and Technology 501 E. St. Joseph Street, Rapid City, South Dakota 57701-3995, U.S.A.
Randy Kath
Affiliation:
South Dakota School of Mines and Technology 501 E. St. Joseph Street, Rapid City, South Dakota 57701-3995, U.S.A.
Michael Spilde
Affiliation:
South Dakota School of Mines and Technology 501 E. St. Joseph Street, Rapid City, South Dakota 57701-3995, U.S.A.
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Abstract

Two methods may be used to measure the reference intensity ratio: (1) by measuring intensities from samples prepared by mixing the analyte and standard together in a known weight ratio and (2) measuring separately the intensities for the analyte peak and reference standard peak from pure phase preparations and by correcting the intensities with mass absorption coefficients. Both methods give identical results that are independent of the difference in mass absorption between analyte and standard. These reference intensity ratios may be universally applied to both matrix flushing and adiabatic procedures in multicomponent analysis providing that preferred orientation, microabsorption, and extinction can be eliminated or greatly minimized in the samples under analysis.

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Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 2 , June 1990 , pp. 76 - 78
Copyright
Copyright © Cambridge University Press 1990

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References

Alexander, L.E.& Klug, H.P.(1948). Anal. Chem. 20, 886–889.CrossRefGoogle Scholar
Bevington, P.R.(1969). Data Reduction and Error Analysis for the Physical Sciences, 336pp. New York: McGraw Hill.Google Scholar
Chung, F.H.(1974a). J. Appl. Cryslallogr. 7, 519–525.CrossRefGoogle Scholar
Chung, F.H.(1974b). J. Appl. Crystallogr. 7, 526–531.CrossRefGoogle Scholar
Davis, B.L.(1981). Atmos. Environ. 15, 291–296.CrossRefGoogle Scholar
Davis, B.L.(1984). In Adv. X-Ray Anal. 27, 339–348. New York: Plenum.Google Scholar
Davis, B.L.(1986). Pow. Diff. 1, 240–243.CrossRefGoogle Scholar
Davis, B.L.(1988). Reference Intensity Method of Quantitative X-Ray Diffraction Analysis, 2nded.. Rapid City, SD: Grelind Photographics and Typesetters.Google Scholar
Davis, B.L.& Johnson, L.R.(1987). In Adv. X-Ray Anal. 30, 333–342. New York: Plenum.Google Scholar
Davis, B.L.& Smith, D.K.(1988). Pow. Diff. 3, 205–208.CrossRefGoogle Scholar
Hubbard, C.R., Evans, E.H.& Smith, D.K.(1976). J. Appl. Crystallogr. 9, 169–174.CrossRefGoogle Scholar
Leroux, J., Lennox, D.H.& Kay, K.(1953). Anal. Chem. 25, 740–743.CrossRefGoogle Scholar
Wolff, P.M. de& Visser, J.W.(1964). T.N.O.Absolute Intensities–Outline of a Recommended Practice. Report 641.109, Technisch Physische Dienst, Delft, HollandGoogle Scholar
Wolff, P.M. de& Visser, J.W.(1988). Pow. Diff. 3, 202–204. This paper is a reprint of their 1964 paper documented just above here.CrossRefGoogle Scholar