Hostname: page-component-74656f9884-54qdv Total loading time: 0 Render date: 2026-11-09T15:29:38.999Z Has data issue: false hasContentIssue false
  • English
  • Français

A Study of the Superconducting La2-xSrxCuO4 System by X-Ray Powder Diffraction

Published online by Cambridge University Press:  10 January 2013

T.C. Huang ,
J.B. Torrance ,
A.I. Nazzal  and
Y. Tokura
T.C. Huang
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
J.B. Torrance
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
A.I. Nazzal
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
Y. Tokura
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
Get access

Abstract

Room temperature crystalline structures of La2-xSrxCuO4 samples with uncommonly high hole concentrations (p) up to p=0.4, annealed under 1 and 100 bars of oxygen pressure have been analyzed by X-ray diffraction. Results show that the x=0 sample with p=0.09 and superconducting below 20K is orthorhombic at room temperature. The orthorhombic distortion at 300K decreases with increasing x and becomes tetragonal when x reaches 0.08. This orthorhombic-to-tetragonal phase transformation is consistent with previous work. Samples with x≥0.28 and p≥0.31 remain tetragonal but are nonsuperconducting down to 5K. Lattice dimension anomalies have also been observed and are correlated with the sudden appearance of oxygen vacancies, as seen by the hole concentration measurements. Initially, the value of the lattice dimension a decreases and c increases monotonically with increasing x. A sudden increase in a and decrease in c begins when x reaches 0.28 for samples prepared under 1 bar of oxygen indicating a sudden loss of oxygen from the structure. This sudden reversal in lattice dimensions a and c is not present in samples annealed under 100 bars of oxygen pressure suggesting essentially no oxygen vacancies. The increase in c with x of the La2-xSrxCuO4 samples with no oxygen vacancies can be attributed mainly to the result of substituting smaller La+3 ions by larger Sr+2 ions. A study of the variation of c with the hole concentration reveals that the c lattice dimension drops sharply with no change in the hole concentration when oxygen is continuously removed from the lattice caused by an increase of the Sr content in La2-xSrxCuO4.

Information

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 3 , September 1989 , pp. 152 - 155
Copyright
Copyright © Cambridge University Press 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Bednorz, J.G. & Müller, K.A. (1986). Z. Phys. 64, 189.CrossRefGoogle Scholar
Cava, R.J., van Dover, R. B., Batlogg, B. & Rietman, E. A. (1987). Phys. Rev. Lett. 58, 408.CrossRefGoogle Scholar
Hinks, D.G., Dabrowski, B., Zhang, K., Segre, C.U., Jorgensen, J.D., Soderholm, L. & Beno, M.A. (1988). Mat. Res. Soc. Symp. Proc. 99, 9, and references therein.CrossRefGoogle Scholar
Huang, T.C. (1988). Aust. J. Phys. 41, 201.CrossRefGoogle Scholar
Huang, T. C, Nazzal, A.I., Tokura, Y., Torrance, J.B. & Karimi, R. (1988). Pow. Diff. 3, 81.CrossRefGoogle Scholar
Huang, T.C. & Parrish, W. (1984). In Adv. X-Ray Anal. 27, 45. New York: Plenum.Google Scholar
Kishio, K., Kitazawa, K., Sugii, N., Kanbe, S., Fueki, K., Takagi, H. & Tanaka, S. (1987). Chem. Lett., 635.Google Scholar
Longo, J.M. & Raccah, P.M. (1973). J. Solid State Chem. 6, 526.CrossRefGoogle Scholar
Nazzal, A.I., Lee, V.L., Engler, E.M., Jacowitz, R.D., Tokura, Y., and Torrance, J.B., (1988). Physica C, Amsterdam 153–155, 1367.Google Scholar
Nguyen, N., Cloisnet, J., Hervieu, M. & Raveau, B. (1981). J. Solid State Chem. 39, 120.CrossRefGoogle Scholar
Parrish, W. & Huang, T.C. (1980). Accuracy of the profile fitting method for X-ray polycrystalline diffractometry. Accuracy in Powder Diffraction, NBS Spec. Publ. (U.S.) 567, U.S. Dept. of Commerce, Washington: U.S. Govt. Printing Office.Google Scholar
Parrish, W. & Huang, T.C. (1983). In Adv. X-Ray Anal. 26, 35. New York: PlenumGoogle Scholar
Powder Diffraction File (1988). Swarthmore, PA: International Centre for Diffraction data.Google Scholar
Torrance, J.B., Tokura, Y., Nazzal, A.I., Bezinge, A., Huang., T.C. & Parkin, S.S.P. (1988). Phys. Rev. Lett. 61, 1127.CrossRefGoogle Scholar
Torrance, J.B., Bezinge, A., Nazzal, A.I., Huang., T.C., & Parkin, S.S.P. (1989). Phys. Rev., submitted.Google Scholar
Shafer, M.W., Penney, T. & Olsen, B.L. (1987). Phys. Rev. B36, 4047.CrossRefGoogle Scholar
Shannon, R.D. & Prewitt, C.T. (1969). Acta Crystallogr. B25, 925.CrossRefGoogle Scholar