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Tests of microstructure reconstruction by forward modeling of high energy X-ray diffraction microscopy data

Published online by Cambridge University Press:  29 February 2012

C. M. Hefferan,
S. F. Li,
J. Lind and
R. M. Suter
C. M. Hefferan*
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213
S. F. Li
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213
J. Lind
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213
R. M. Suter
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213
*
a)Author to whom correspondence should be addressed. Electronic mail: cheffera@andrew.cmu.edu
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Abstract

Verification tests of the forward modeling technique for near-field high energy X-ray diffraction microscopy are conducted using two simulated microstructures containing uniformly distributed orientations. Comparison between the simulated and reconstructed microstructures is examined with consideration to both crystallographic orientation and spatial geometric accuracy. To probe the dependence of results on experimental parameters, simulated data sets use two different detector configurations and different simulated experimental protocols; in each case, the parameters mimic the experimental geometry used at Advanced Photon Source beamline 1-ID. Results indicate that element orientations are distinguishable to less than 0.1°, while spatial geometric accuracy is limited by the detector resolution.

Keywords

microstructuresynchrotron radiationhigh energy diffraction microscopynondestructive orientation imaging

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Type
Technical Articles
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010, pp. 132 - 137
Copyright
Copyright © Cambridge University Press 2010

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