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Update in a Rietveld analysis program for x-ray powder spectro-diffractometry

Published online by Cambridge University Press:  05 March 2012

Yanan Xiao ,
Fujio Izumi ,
Timothy Graber ,
P. James Viccaro  and
Dale E. Wittmer
Yanan Xiao
Affiliation:
Department of Mechanical Engineering and Energy Processes, Southern Illinois University, Carbondale, Illinois The Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637
Fujio Izumi
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, 1-1 Namiki, Ibaraki 305-0044, Japan
Timothy Graber
Affiliation:
The Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637
P. James Viccaro
Affiliation:
The Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637
Dale E. Wittmer
Affiliation:
Department of Mechanical Engineering and Energy Processes, Southern Illinois University, Carbondale, Illinois 62901
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Abstract

A computer program for refining anomalous scattering factors using x-ray powder diffraction data was revised on the basis of the latest version of a versatile pattern-fitting system, RIETAN-2000. The effectiveness of the resulting program was confirmed by applying it to simulated and measured powder-diffraction patterns of Mn3O4 taken at a synchrotron light source.

Keywords

Rietveld analysisspectro-diffractometryanomalous scatteringRIETANsynchrotron x-ray powder diffraction

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Type
Technical Articles
Information
Powder Diffraction , Volume 18 , Issue 1 , March 2003 , pp. 32 - 35
Copyright
Copyright © Cambridge University Press 2003

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