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X-ray powder diffraction study of ZnGa2Te4

Published online by Cambridge University Press:  05 March 2012

Rashmi  and
U. Dhawan
Rashmi*
Affiliation:
X-ray Analysis, Materials Characterization Division, National Physical Laboratory Dr. K. S. Krishnan Marg, New Delhi 110 012, India
U. Dhawan*
Affiliation:
X-ray Analysis, Materials Characterization Division, National Physical Laboratory Dr. K. S. Krishnan Marg, New Delhi 110 012, India
*
a)Electronic mail: rashmi@csnpl.ren.nic.in
a)Electronic mail: rashmi@csnpl.ren.nic.in
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Abstract

ZnGa2Te4 was found to crystallize in a defect tetrahedral structure with possible space group I4(82) with Z=2. Complete X-ray powder diffraction data were obtained and the unit cell parameters a and c and X-ray density were calculated. These were a=0.5930(1) nm, c=1.1859(3) nm, and Dx=5.7×103 kg/m3.

Keywords

chalcogenides, ZnGa2Te4defect tetrahedral structureX-ray diffractioncrystal structurepowder diffraction data

Information

Type
New Diffraction Data
Information
Powder Diffraction , Volume 17 , Issue 1 , March 2002 , pp. 41 - 43
Copyright
Copyright © Cambridge University Press 2002

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