Hostname: page-component-74656f9884-2dmjx Total loading time: 0 Render date: 2026-11-08T12:06:17.617Z Has data issue: false hasContentIssue false
  • English
  • Français

Reliability of Complex Devices in Random Environments

Published online by Cambridge University Press:  27 July 2009

E. Çinlar  and
S. Özekici
E. Çinlar
Affiliation:
Department of Civil EngineeringPrinceton University Princeton, New Jersey
S. Özekici
Affiliation:
Department of Industrial EngineeringBosphorus University Bebek, Istanbul, Turkey
Get access Rights & Permissions [Opens in a new window]

Abstract

The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. We introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory conditions. The computations needed for randomly varying conditions are recursive and can be used for making decisions regarding maintenance and replacement.

Information

Type
Articles
Information
Probability in the Engineering and Informational Sciences , Volume 1 , Issue 1 , January 1987 , pp. 97 - 115
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

A-Hameed, M. S. and Proschan, F. (1973). Nonstationary shock models. Stoch. Process. Appl. 1: 383–404.CrossRefGoogle Scholar
A-Hameed, M. S. and Proschan, F. (1975). Shock models with underlying birth process. J. Appl. Probab. 12: 18–28.CrossRefGoogle Scholar
Çinlar, E. (1969). On semi-Markov processes on arbitrary spaces. Proc. Cambridge Phil. Soc. 66: 381–392.CrossRefGoogle Scholar
Çinlar, E. (1975). Introduction to Stochastic Processes, Prentice-Hall, Englewood-Cliffs, New Jersey, p. 313–362.Google Scholar
Çinlar, E. (1977). Shock and wear models and Markov additive processes. In The Theory and Applications of Reliability, vol. 1, ed. by Shimi, I. N. and Tsokos, C. P.. Academic Press, New York, p. 193–214.Google Scholar
Çinlar, E. (1984). Markov and Semimarkov models of deterioration. In Reliability Theory and Models, ed. by Abdel-Hameed, M. S., Çinlar, E. and Quinn, J.. Academic Press, Orlando, Florida, p. 3–41.CrossRefGoogle Scholar
Esary, J. D. and Marshall, A. W. (1974). Families of components and systems exposed to a compound Poisson damage process. In Reliability and Biometry, ed. by Proschan, F. and Serfling, R. J.. SIAM, Philadelphia, Pennsylvania.Google Scholar
Esary, J. D., Marshall, A. W., and Proschan, F. (1973). Shock models and wear processes. Ann. Probab. 1: 627–649.CrossRefGoogle Scholar
Feldman, R. M. (1976). Optimal replacement for semi-Markov shock models. J. Appl. Probab. 13: 195–199.CrossRefGoogle Scholar
Feldman, R. M. (1977). Optimal replacement for systems governed by Markov additive shock processes. Ann. Probab. 5: 413–429.CrossRefGoogle Scholar
Lindley, D. V. and Singpurwalla, N. D. (1984). Multivariate distributions for the reliability of a system of components sharing a common environment. Technical Report, George Washington University, Institute of Reliability and Risk Analysis.Google Scholar
Mastran, D. V. and Singpurwalla, N. D. (1978). A Bayesian estimation of the reliability of coherent structures. Oper. Res. 26: 663–672.CrossRefGoogle Scholar
Parkus, H. and Bargman, H. (1970). Note on the behavior of thermorheologically simple materials in random temperature fields. Acta Mechanica 9: 152–257.CrossRefGoogle Scholar
Shaked, M. (1977). A concept of positive dependence for exchangeable random variables. Ann. Statist. 5: 505–515.CrossRefGoogle Scholar
Winterbottom, A. (1984). The interval estimation of system reliability from component test data. Oper. Res. 32: 628–640.CrossRefGoogle Scholar