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Predictors for readmission risk in schizophrenia

Published online by Cambridge University Press:  09 July 2009

P. B. Mortensen and
W. W. Eaton
P. B. Mortensen*
Affiliation:
Institute of Basic Psychiatric Research, Department of Psychiatric Demography, Psychiatric Hospital, Risskov, Denmark; and Johns Hopkins University, School of Hygiene and Public Health, Department of Mental Hygiene, Baltimore, Maryland, USA
W. W. Eaton
Affiliation:
Institute of Basic Psychiatric Research, Department of Psychiatric Demography, Psychiatric Hospital, Risskov, Denmark; and Johns Hopkins University, School of Hygiene and Public Health, Department of Mental Hygiene, Baltimore, Maryland, USA
*
1Address for correspondence: Dr Preben Bo Mortensen, Department of Psychiatric Demography, Psychiatric Hospital, DK-8240 Risskov, Denmark.
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Synopsis

Readmission risk was assessed at the first and subsequent discharges in a total Danish national sample consisting of 8705 first admitted patients who had been discharged alive at least once with a diagnosis of schizophrenia. Predictors for readmission risk were identified using the Cox proportional hazards model. Following the first discharge, 19% of the surviving patients had not been readmitted after 10 years of follow-up. Readmission risk increased with the number of previous admissions. At the first discharge readmission risk decreased with increasing age and was significantly predicted by clinical subtype and gender. At later discharges (5th, 10th, and 15th) the effect of these variables gradually disappeared. At the 15th discharge readmissions were mainly predicted by the duration of the latest admission and discharge periods. Both the increase in readmission risk with the number of previous admissions and the evolving pattern of predictors for readmission risk are interpreted as supporting the existence of a smaller subpopulation among schizophrenic patients with frequent relapses.

Information

Type
Original Articles
Information
Psychological Medicine , Volume 24 , Issue 1 , February 1994, pp. 223 - 232
Copyright
Copyright © Cambridge University Press 1994

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