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Using Response Times to Detect Aberrant Responses in Computerized Adaptive Testing

Published online by Cambridge University Press:  01 January 2025

Wim J. van der Linden  and
Edith M. L. A. van Krimpen-Stoop
Wim J. van der Linden*
Affiliation:
University of Twente
Edith M. L. A. van Krimpen-Stoop
Affiliation:
University of Twente
*
Requests for reprints should be sent to W.J. van der Linden, Department of Research Methodology, Measurement and Data Analysis, University of Twente, P.O. Box 217, 7500 AE Enschede, THE NETHERLANDS. E-Mail: w.j.vanderlinden@utwente.nl
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Abstract

A lognormal model for response times is used to check response times for aberrances in examinee behavior on computerized adaptive tests. Both classical procedures and Bayesian posterior predictive checks are presented. For a fixed examinee, responses and response times are independent; checks based on response times offer thus information independent of the results of checks on response patterns. Empirical examples of the use of classical and Bayesian checks for detecting two different types of aberrances in response times are presented. The detection rates for the Bayesian checks outperformed those for the classical checks, but at the cost of higher false-alarm rates. A guideline for the choice between the two types of checks is offered.

Keywords

aberrant response patternscomputerized adaptive testingposterior predictive checksperson misfitresidual analysisresponse times

Information

Type
Articles
Information
Psychometrika , Volume 68 , Issue 2 , June 2003 , pp. 251 - 265
Copyright
Copyright © 2003 The Psychometric Society

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Footnotes

This study received funding from the Law School Admission Council (LSAC). The opinions and conclusions contained in this paper are those of the authors and do not necessarily reflect the policy and position of LSAC. The authors are most indebted to Wim M. M. Tielen for his computational assistance and to the US Defense Manpower Data Center for the permission to use the ASVAB data set in the empirical examples.

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