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Memory Effects in an AMS System: Catastrophe and Recovery

Published online by Cambridge University Press:  18 July 2016

J S Vogel
Affiliation:
Department of Archaeology, Simon Fraser University, Burnaby, BC V5A 1S6 Canada
J R Southon
Affiliation:
Department of Archaeology, Simon Fraser University, Burnaby, BC V5A 1S6 Canada
D E Nelson
Affiliation:
Department of Archaeology, Simon Fraser University, Burnaby, BC V5A 1S6 Canada
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Abstract

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A sample with a 14C concentration estimated to be greater than 30,000 Modern was inadvertently graphitized and measured in an AMS system. No measurable contamination of the cesium sputter ion source was observed. Simple cleaning procedures removed the contamination from the sample preparation system, with the exception of the reaction vessel in which the sample was graphitized. Sample cross-contamination factors were estimated for all of the preparation and measurement procedures.

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Copyright
Copyright © 1990 The American Journal of Science