Hostname: page-component-7b7567c8c-2n9c9 Total loading time: 0 Render date: 2026-11-15T02:03:31.114Z Has data issue: false hasContentIssue false

The formation of α + β microstructure in as-fabricated selective laser melting of Ti–6Al–4V

Published online by Cambridge University Press:  25 July 2014

Marlo Simonelli*
Affiliation:
Department of Materials, Loughborough University, Loughborough LE11 3TU, United Kingdom
Yau Yau Tse
Affiliation:
Department of Materials, Loughborough University, Loughborough LE11 3TU, United Kingdom
C. Tuck
Affiliation:
Additive Manufacturing and 3D Printing Research Group, Department of Mechanical, Materials and Manufacturing Engineering, Faculty of Engineering, The University of Nottingham, Nottingham NG7 2RD, United Kingdom
*
a) Address all correspondence to this author. e-mail: M.Simonelli@lboro.ac.uk

Abstract

Ti–6Al–4V parts made by the additive manufacturing (AM) technique selective laser melting (SLM) generally show poor ductility due to their fine martensitic microstructure. This study was designed to assess whether a more suitable microstructure can be obtained when long laser/material interaction times are used. As-fabricated components with an α + β microstructure were produced and characterized with various microscopy techniques. The microstructural evolution was discussed in relation to the build platform temperature, the cyclic reheating, and the thermal stresses that developed during the process. The hardness of the samples was also evaluated and discussed. The hardness varied in relation to the different microstructure morphologies observed in the samples and different partitioning of the alloying elements. This study indicates a methodology through SLM to obtain Ti–6Al–4V with an as-deposited α + β microstructure which is more desirable than that the typical fully martensitic microstructure typically obtained after SLM.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

TABLE I.Chemical composition of the powders used in this study.

Figure 1

TABLE II.Comparison of the process parameters used in this research and those typical used for SLM of Ti–6Al–4V.

Figure 2

FIG. 1.Schematic diagram of the scan strategy. Each layer (N) is scanned twice. During the remelting of the same layer (N′), the scan direction is rotated by 90°.

Figure 3

FIG. 2.Backscatter micrograph showing the bimodal microstructure of the forged reference Ti–6Al–4V plate.

Figure 4

FIG. 3.Optical micrograph showing the microstructure of samples on the frontal plane (xz-plane). The micrograph shows the typical porosity observed in the samples. Macroscopic banding is also evident in the image as dark wavy areas that cross the columnar grains.

Figure 5

FIG. 4.(a) Backscatter micrograph from the xz-frontal plane of a sample showing the approximate locations where the microstructure was studied. Starting from the bottom of the sample, the microstructure is composed of α + β phases arranged with (b) fully lamellar, (c) fully equiaxed, (d), (e), and (f) bimodal morphologies; (g) the last deposited layer is instead fully martensitic.

Figure 6

Table III.Chemical composition (weight %) of the different microstructures observed in the SLM Ti-6Al-4V and the reference material.

Figure 7

FIG. 5.Phase maps, IPF orientation maps, and corresponding color schemes showing the microstructure evolution along the building direction. (a) fully lamellar, (b) fully equiaxed, (c), (d) bimodal and (e) fully martensitic microstructures.

Figure 8

FIG. 6.Backscatter micrographs showing the microstructure of (a) as-built and (b) stress relieved SLM Ti–6Al–4V obtained under typical processing conditions reported in the literature.

Figure 9

TABLE IV.Tensile properties of as-built and stress relieved SLM Ti–6Al–4V (zx-orientation).

Figure 10

FIG. 7.Variation of the hardness with the distance from the building platform. The highest value of the hardness was measured in the fully equiaxed region of the specimens.

Figure 11

FIG. 8.Backscatter micrograph showing (a) the microstructure in correspondence of the observed bands; (b) a higher magnification of the marked area in (a). The red lines indicate the change of the predominant α grain alignment inside and outside the band.