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X-ray and neutron total scattering analysis of Hy ·(Bi0.2Ca0.55Sr0.25)(Ag0.25Na0.75)Nb3O10·xH2O perovskite nanosheet booklets with stacking disorder

Published online by Cambridge University Press:  23 May 2016

Peter Metz
Affiliation:
Inamori School of Engineering, Alfred University, Alfred, New York 14802
Robert Koch
Affiliation:
Department of Civil, Environmental, and Mechanical Engineering, University of Trento, Via Mesiano, 77, Trento, TN 38123, Italy
Bernadette Cladek
Affiliation:
Inamori School of Engineering, Alfred University, Alfred, New York 14802
Katharine Page
Affiliation:
Neutron Science Directorate, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
Joerg Neuefeind
Affiliation:
Neutron Science Directorate, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
Scott Misture*
Affiliation:
Inamori School of Engineering, Alfred University, Alfred, New York 14802
*
Author to whom correspondence should be addressed. Electronic mail: misture@alfred.edu

Abstract

Ion-exchanged Aurivillius materials form perovskite nanosheet booklets wherein well-defined bi-periodic sheets, with ~11.5 Å thickness, exhibit extensive stacking disorder. The perovskite layer contents were defined initially using combined synchrotron X-ray and neutron Rietveld refinement of the parent Aurivillius structure. The structure of the subsequently ion-exchanged material, which is disordered in its stacking sequence, is analyzed using both pair distribution function (PDF) analysis and recursive method simulations of the scattered intensity. Combined X-ray and neutron PDF refinement of supercell stacking models demonstrates sensitivity of the PDF to both perpendicular and transverse stacking vector components. Further, hierarchical ensembles of stacking models weighted by a standard normal distribution are demonstrated to improve PDF fit over 1–25 Å. Recursive method simulations of the X-ray scattering profile demonstrate agreement between the real space stacking analysis and more conventional reciprocal space methods. The local structure of the perovskite sheet is demonstrated to relax only slightly from the Aurivillius structure after ion exchange.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2016 
Figure 0

Figure 1. (Color online) Rietveld refinement of (a) APS X-ray data and (b) NOMAD bank 2 demonstrate good fit using the B2cb unit cell represented in (c).

Figure 1

Table I. Refined structure of the Aurivillius material Ag25-BCNN3.

Figure 2

Figure 2. (Color online) (a) Rw as a function of d001 for several test structures near dmin. (b) Neutron PDF for the calculated points in (a). (c) Inspection of the interlayer region for a better (left) and worse (right) fitting model. (d) Rw resulting from combinations of the translational components Rx and Ry.

Figure 3

Figure 3. (Color online) (a) (ii) Best-fits for the neutron PDF for a single stacking model (1/4, 1/4, 13.825 Å) and (i) a distributed stacking model following the weight distribution σ = 0.125 in (b), and the associated difference curves (i–iii, ii–iv). The mean fractional coordinate for each distribution is μ = 0.25. The resulting weighted residual for various distributions in (b) are plotted in (c).

Figure 4

Figure 4. (Color online) (left) An overlay of Rietveld and PDF refined perovskite block indicate the cation sublattice is invariant, while the oxygen sublattice relaxes, leading (a) to NbO6 distortion (φ) and (b) to greater octahedral tilt (θ).

Figure 5

Table II. Select parameters highlighting the slight relaxation of the perovskite structure following the ion exchange reaction.

Figure 6

Figure 5. (Color online) (a) (i) Experimental data for Ag25-BCNN3-IE collected on APS 11-ID-B (λ = 0.2114 Å), and DIFFaX simulations of (ii) discrete combinations of Rx = Ry < 1/2, (iii) fully turbostratic and (iv) a single sheet. (b) A schematic representation of the stacking model.

Figure 7

Figure 6. (Color online) The influence of hk-bands arising from individual stacking vectors demonstrates that the experimental data are clearly the influence of a distribution.

Figure 8

Figure 7. (Color online) A comparison of (a) the stacking distribution applied in the DIFFaX simulation [Figure 5(a) (ii)], (b) the PDF model for the stacking distribution [Figure 3(a) (i)], and the distribution suggested by the fit surface Rw (Rx, Ry) [Figure 2(d)]. The corresponding standard deviation σ in fractional & (Å) units respectively are (a) 0.092 (0.50 Å) and (b) 0.125 (0.69 Å). The weighted residual for PDF fits using each respective distribution are (a) 0.297, (b) 0.300, and (c) 0.304.

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