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Enhanced dynamic range spatio-spectral metrology of few-cycle laser pulses

Published online by Cambridge University Press:  03 August 2026

Cristian Alexe
Affiliation:
Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, Măgurele, Romania Doctoral School of Physics, University of Bucharest, Măgurele, Romania Engineering and Applications of Lasers and Accelerators Doctoral School (SDIALA), National University of Science and Technology Politehnica of Bucharest, Bucharest, Romania
Aaron Liberman
Affiliation:
Department of Physics of Complex Systems, Weizmann Institute of Science, Rehovot, Israel
Saga Westerberg
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Andrea Angella
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Anda-Maria Talposi
Affiliation:
Department of Physics of Complex Systems, Weizmann Institute of Science, Rehovot, Israel
Ann-Kathrin Raab
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Erik Löfquist
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Alice Dumitru
Affiliation:
Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, Măgurele, Romania Doctoral School of Physics, University of Bucharest, Măgurele, Romania Engineering and Applications of Lasers and Accelerators Doctoral School (SDIALA), National University of Science and Technology Politehnica of Bucharest, Bucharest, Romania
Andrew H. Okukura
Affiliation:
Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, Măgurele, Romania Doctoral School of Physics, University of Bucharest, Măgurele, Romania Engineering and Applications of Lasers and Accelerators Doctoral School (SDIALA), National University of Science and Technology Politehnica of Bucharest, Bucharest, Romania
Flanish D’Souza
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Cornelia Gustafsson
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Anders Persson
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Chen Guo
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Cord Arnold
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Olle Lundh
Affiliation:
Department of Physics, Lund University, Lund, Sweden
Victor Malka
Affiliation:
Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, Măgurele, Romania Department of Physics of Complex Systems, Weizmann Institute of Science, Rehovot, Israel
Daniel Ursescu*
Affiliation:
Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, Măgurele, Romania Doctoral School of Physics, University of Bucharest, Măgurele, Romania Engineering and Applications of Lasers and Accelerators Doctoral School (SDIALA), National University of Science and Technology Politehnica of Bucharest, Bucharest, Romania
*
Correspondence to: D. Ursescu, Extreme Light Infrastructure - Nuclear Physics, Horia Hulubei National Institute for Physics and Nuclear Engineering, 30 Reactorului Street, 077125 Măgurele, Romania. Email: daniel.ursescu@eli-np.ro

Abstract

Accurate spatio-temporal and spatio-spectral metrology is critical to the characterization and use of ultra-short, high-power lasers. The emergence of few-cycle pulses, with bandwidths of tens or hundreds of nanometers, poses a significant challenge to existing metrology techniques. This is due to a combination of large discrepancies in sensor sensitivity and significant variations in the pulse’s spectral intensity at those wavelengths. In this paper, the authors propose spectral filtering and stitching of the measurements as a robust, simple solution that enhances the dynamic range of the measurements, allowing accurate few-cycle pulse reconstruction. This enhancement is demonstrated using INSIGHT – the most commonly used spatio-spectral measurement device – as well as using the IMPALA technique and spatially resolved Fourier transform spectrometry.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2026. Published by Cambridge University Press in association with Chinese Laser Press
Figure 0

Figure 1 Pulse characterization of the LUCID laser. (a) Dispersion scan measurement. (b) Retrieval of the temporal pulse shape. (c) Retrieved spectrum and spectral phase of the laser.Figure 1. long description.

Figure 1

Figure 2 (a) Schematic of the experimental setup. The laser path is shown, as well as the spectral filter (F), IMPALA mask (IP), and focusing off-axis parabola (OAP1). A removable mirror (RM1) channels the laser into the INSIGHT measurement. A removable mirror (RM2) sends the beam to a focused beam camera monitor (FC). A different removable mirror (RM3) channels the beam to the focal spot/IMPALA camera (IC). Finally, without both mirrors the beam goes to another off-axis parabola (OAP2) and is steered into the SRFTS measurement. (b) Detailed schematic of the INSIGHT measurement: mirrors M1 and M2 together with BS1 form a Michelson interferometer. Mirror M3 and BS2 are used to look after the focal spot on the Z+ camera. BS3 and M4 redirect the beam towards Z– and Z0 cameras. The direct camera (DC) is used for pointing stabilization. (c) Detailed schematic of the SRFTS measurement: BS1 is a 10/90 beam splitter cube, M denotes flat mirrors, the arrow denotes movement of the piezo stage, P is a 50 mm focusing parabola, BS2 is a 2% reflection beam splitter and CCD denotes the camera. The inserts exemplify recorded raw images of the cameras.Figure 2. long description.

Figure 2

Figure 3 Overview of the IMPALA technique. (a) Pinhole mask designed by a genetic algorithm for the LLC laser system measurement. (b) Raw interference speckle pattern for 760 nm obtained by passing the beam through the mask and focusing. Red colorscale shows relative intensity. (c) Streak pattern obtained by performing a spatial Fourier transform on the interference speckles. These streaks contain spatially separated chromatic information about the beam. (d) Retrieved wavefront for one particular spectral band of the LLC laser. Colorscale shows phase from -π to π. Blue dots indicate the spatial points at which the wavefront is sampled.Figure 3. long description.

Figure 3

Figure 4 Spectral (a)–(c) and temporal (d)–(f) properties inferred from the measurements. (a) Spatially integrated INSIGHT spectra from the measurements without a filter and with an 850 nm cutoff filter (solid lines with shading), and the spectrum measured with a spectrometer (dotted line). Spatio-spectral reconstruction of the direct INSIGHT measurement (raw data) (b) and stitched data from the two measurements (raw data) (c). (d) Fourier-transform-limited (FTL) pulse duration obtained from the spatially integrated direct INSIGHT measurement (solid line with shading) and from the spectrometer data (dotted line). Spatio-temporal reconstruction using the direct INSIGHT measurement (e) and using the stitched data from the measurements (f).Figure 4. long description.

Figure 4

Figure 5 Impact of dynamic range enhancement on IMPALA data. (a) IMPALA streaks (blue) for the LLC laser without any spectral filtering as well as the simulated quasi-monochromatic streaks centered at 720, 760, 800, 840 and 880 nm (shown in pink). The insert shows an enlarged example of a streak. (b) IMPALA streaks for the LLC laser with the 850 nm spectral filter in place. (c) IMPALA streaks obtained by summing the results of the no filter and 850 nm filter cases. All areas with signal are normalized to the same value. (d) IMPALA streaks obtained by summing the results of the no filter and 850 nm filter cases. The blue colorbar shows the places where just one signal is present or where overlapping signals are present. (e) Retrieved 760 nm wavefront for the LLC laser. Colorscale shows phase from -π to π. Blue dots indicate the spatial points at which the wavefront is sampled. (f) Retrieved 840 nm wavefront.Figure 5. long description.

Figure 5

Figure 6 Retrieved spectrum from the SRFTS measurement with no filter (blue) and with the long-pass filter at 850 nm (red).Figure 6. long description.