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Characterization of electron density of states in laser-superposed channeling regime

Published online by Cambridge University Press:  10 October 2014

Vesna Berec*
Affiliation:
The University of Belgrade, St. trg 1, 11000 Belgrade, Serbia
*
Address correspondence and reprint requests to: Vesna Berec, The University of Belgrade, St. trg 1, 11000 Belgrade, Serbia. E-mail: vesna.berec@gmail.com

Abstract

We present low-dimensional functionalization and characterization of electron density of states using highly correlated/precisely guided proton beam trajectories and a silicon nanocrystal as a target, representing at a same time a versatile nanolaser technique capable for coherent control of atomic quantum states and for scanning the interior of an atom with resolution comparable to 10% of the Bohr radius.

Information

Type
Research Article
Copyright
Copyright © Cambridge University Press 2014 
Figure 0

Fig. 1. Influences of the Thomas-Fermi-Molière interaction potential (red circles) and Ziegler-Biersack-Littmark Universal interaction potential (black circles) of the perfectly collimated proton beam, taken for <111> axial channel of 100 nm thick silicon, according to different radial distances from the atomic strings (lying on three nearest square coordination lines of the <111> axial channel) and various tilt angles. Bright areas (intensities are shown in normalized color scale) show the channel area where the corresponding potentials exhibit the strongest confinement effect.

Figure 1

Fig. 2. A schematic representation of the measurement setup: laser system (vertical) and perfectly collimated (perpendicular) proton beam. Right top corner: tomographic result of electron DOS obtained for the considered silicon nano-crystal target.

Figure 2

Fig. 3. A schematic of the ‘‘standard’’ experimental setup, representing the main part of the beam-line focused with a spherical lens to the target position and exit plane axial collection of the swift protons, with a pierced mirror and a spherical lens on entrance of a fiber optic coupled with the detector. After passing the beam combiner, the laser beam (red) and the proton beam (blue) are spatially separated by the critical angle for <111> silicon: φ = ψc.

Figure 3

Fig. 4. Proton beam intensity distribution in transverse position plane and the tomographic reconstruction of the highest occupied atomic orbital representing electron DOS in the 5 nm focal region inside the silicon nanocrystal core, obtained by the numerical probe. Here applied Thomas-Fermi-Molière interaction potential includes real data parameters: Debye thermal vibration amplitude (σth = 7.4 pm), exact Young's modulus which is largest along the <111> silicon axis (E = 187.5 GPa) and high mechanical quality factor of silicon (Q > 107). DOS along the x − y axis are obtained in the configuration phase space and velocity phase space for L = 100 nm thick silicon nanocrystal. Two-dimensional representation of channeled proton flux is shown for the proton beam incident angles: φ = 0.05ψc, 0.15ψc (the proton beam energies are 3 and 3.5 MeV) in the transverse position plane. The corresponding Gaussian fits are red colored.

Figure 4

Fig. 5. Numerically obtained transmission patterns in the exit — scattering-angle plane of 100 nm thick silicon nanocrystal. The ion beam divergence is set to 0.1 mrad. Two-dimensional representation of the hyperchanneled proton trajectories evolution with incident angles: (a) φ = 0, (b) φ = 0.05ψc, (c) φ = 0.10ψc, (d) φ = 0.15ψc, and (e) φ = 0.20ψc, corresponding to nanocrystal thickness of L = 100 nm, are mapped from the transverse position plane (according to Eq. (8)).

Figure 5

Fig. 6. The axial yield (flux) of 2 MeV channeled protons as a function of the reduced nanocrystal thickness in vicinity of the super-focusing point (0.25) for the tilt angles φ = 0 and φ = 0.10ψc along y axis in the transverse position plane, numerical simulation results obtained using the MC FLUX code.

Figure 6

Fig. 7. Calculated maximal axial flux intensities for super-focused proton beam in the transverse position plane. The fixed zero tilts parameters, φ = 0, are taken in different positions relative to nanocrystal channel <111> axis corresponding to points: Λ = 0.24, 0.25, and 0.26. The distance between the maxima of the proton yields induced by channeled proton confinement field is calculated via π2ħ2(n + 1/2)/(L2 me), L = 100 nm, for n-discretized 2-d proton nanocrystal crystal potential.

Figure 7

Fig. 8. The proton axial yield projection in the transverse position plane at the super-focusing point (Λ = 0.25), for angle φ = 0, numerical simulation results obtained using the FLUX code.

Figure 8

Fig. 9. Comparison of the proton beam intensity profiles (different transverse cross-sections) for the tilt angle φ = 0.10ψc that corresponds to 10% of the critical angle for channeling, relative to super-focusing point, obtained for different longitudinal (L) and transversal (x) thickness of the nanocrystal, numerical simulation results obtained using the FLUX code.

Figure 9

Fig. 10. Right: two-dimensional intensity profile of the highest occupied atomic orbital representing electron DOS in 〈111〉 silicon nanocrystal channel obtained for the beam angle 0.20ψc. Left: 3d-surface slices in angular-exit nanocrystal plane obtained for the same angle, 0.20ψc.