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Electronic properties of transition-metal dichalcogenides

Published online by Cambridge University Press:  13 July 2015

Agnieszka Kuc
Affiliation:
Jacobs University Bremen, Germany; a.kuc@jacobs-university.de
Thomas Heine
Affiliation:
Jacobs University Bremen, Germany; t.heine@jacobs-university.de
Andras Kis
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland; andras.kis@epfl.ch

Abstract

Graphene is not the only prominent example of two-dimensional (2D) materials. Due to their interesting combination of high mechanical strength and optical transparency, direct bandgap and atomic scale thickness transition-metal dichalcogenides (TMDCs) are an example of other materials that are now vying for the attention of the materials research community. In this article, the current state of quantum-theoretical calculations of the electronic and mechanical properties of semiconducting TMDC materials are presented. In particular, the intriguing interplay between external parameters (electric field, strain) and band structure, as well as the basic properties of heterostructures formed by vertical stacking of different 2D TMDCs are reviewed. Electrical measurements of MoS2, WS2, and WSe2 and their heterostructures, starting from simple field-effect transistors to more demanding logic circuits, high-frequency transistors, and memory devices, are also presented.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2015 
Figure 0

Figure 1. (a) Three-dimensional representation of the structure of transition-metal dichalcogenides (TMDCs) with the common formula MX2. Single layers can be extracted and used as the starting point for fundamental research and device applications. (b) Structure (top) and band structure (bottom) of monolayer MoS2 in 2H, trigonal prismatic, (left) and 1T, octahedral, (right)8 symmetry. The Fermi level (EF) is indicated by the red dashed line. Courtesy of Nourdine Zibouche (Jacobs University Bremen). Note: E, energy.

Figure 1

Table I. Overview of stable layered transition-metal dichalcogenides.

Figure 2

Figure 2. (a) Structure of 2H MX2 monolayers (MLs) with high-symmetry reflection planes Rx and Rz, and the Brillouin zone with its high-symmetry k points. (c) The same information for the bilayer (BL) system, with the inversion point I indicated. (b) Band structure of MoS2 (top) and WSe2 (bottom) for ML (a) and BL (c). The Fermi level (EF) is indicated by a red dashed line. The valence band (blue) and conduction band (green) frontier orbitals are marked. The red arrow shows the lowest energy electronic excitation, indicating a direct bandgap for the MLs, but an indirect one for the BLs. Bandgaps (Δ) and spin–orbit splitting (ΔSOC) are indicated. Adapted with permission from Reference 40.

Figure 3

Figure 3. (a) The electric field (Efield) normal to the lattice plane is indicated. (b) The electric field breaks the degeneracy of the opposite spin orbitals at different valleys K and K′, thus introducing a spin–orbit (SO) splitting. σ– (σ+) denotes left (right)-handed circularly polarized light that couples to the band-edge transitions at K (K′) point. (c) SO splitting (ΔSOC) in MX2 bilayers (BLs) as a function of an external electric field normal to the lattice plane. Electric field already induces SO splitting in the MX2 BLs for weak fields and quickly saturates to values typically observed in their respective monolayers.41 Note: SOC, spin–orbit coupling.

Figure 4

Figure 4. (a) Bandgap change (Δ) of Group 6 2H MX2 materials as a function of a perpendicular electric field (Efield).41 Semiconductor–metal transition is achieved for a field strength of at least 1.2 V Å–1. (b) Bandgap change as a function of lattice parameter a.44 The equilibrium value is marked with a red circle. The range of direct bandgap transition is marked with dotted vertical lines and labeled ΔD. Outside this small region around the equilibrium distance, the bandgap is indirect (ΔI). The bandgap reduces almost linearly for compression (to the left) and expansion (to the right), where a semiconductor–metal transformation is reached at ∼10% strain. The figure also includes the reciprocal lattice points at which the smallest energy transition from valence to conduction band is possible.

Figure 5

Figure 5. (a) Schematic representation of the first top-gated field-effect transistor with a 2D transition-metal dichalcogenide (MoS2) channel. (b) Device current as a function of gate voltage. The transistor could be completely turned OFF for gate voltages <–2 V, and it showed an ON/OFF current ratio of 108. Inset: current as a function of bias voltage, showing linear Ids–Vds curves for small bias voltages.7

Figure 6

Figure 6. (a) Density of states (DOS) for MoS2, including both localized band-tail and mid-gap localized states. Emid is the energy level in the middle of the bandgap and EM is the energy of the mobility edge. Inset shows a simplified band diagram of the device. (b) Multi-frequency capacitance of a MoS2 test structure as a function of gate voltage (Vtg). Cox is the oxide capacitance. The symbols are experimental results, and the lines indicate modeling results.63 Data and the model show reasonable agreement. Adapted with permission from Reference 63. © 2014 Nature Publishing Group. Note: HK, high-κ (dielectric constant) dielectric; EF, Fermi energy.

Figure 7

Figure 7. (a) MoS2/graphene heterostructure memory based on a MoS2 transistor with graphene contacts. (b) Optical image of MoS2 contacted by graphene (upper panel) and multilayer graphene floating gates deposited on top of the semiconducting channel (lower panel).80 Note: ML, monolayer.