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Effects of the microstructure of ZnO seed layer on the ZnO nanowire density

Published online by Cambridge University Press:  16 May 2011

Jaehyun Yang
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
Myung Soo Lee
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
Kyung Park
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
Mi Ran Moon
Affiliation:
Department of Physics, Brain Korea 21 Physics Research Division, Institute of Basic Science, Sungkyunkwan University, Suwon 440-746, Korea
Donggeun Jung
Affiliation:
Department of Physics, Brain Korea 21 Physics Research Division, Institute of Basic Science, Sungkyunkwan University, Suwon 440-746, Korea
Hyoungsub Kim*
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
Hoo-Jeong Lee*
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
*
a)Address all correspondence to these authors. e-mail: hsubkim@skku.edu
b)e-mail: hlee@skku.edu

Abstract

In this study, we synthesized ZnO nanowires using Au catalytic particles formed on a ZnO seed layer. We modulated the microstructure of the ZnO seed layer by changing the sputtering power to investigate how the underlying ZnO film microstructure affects the distribution of ZnO nanowires. Examining the samples after each of the three key steps of the growth process (ZnO seed layer deposition, Au catalytic particle formation, and nanowire growth) using various characterization methods such as scanning electron microscopy, transmission electron microscopy, and x-ray diffraction helped us illuminate the profound impacts of the grain size of the seed layer on the nanowire density.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1. Plan-view transmission electron microscope (TEM) images of ZnO seed layers deposited at different RF powers after annealing at 990 °C: (a) 50 W, (b) 250 W, and (c) 450 W.

Figure 1

FIG. 2. Scanning electron microscope (SEM) images of Au catalytic particles formed on the ZnO seed layers grown under different RF powers after annealing at 990 °C: (a) 50 W, (b) 150 W, (c) 250 W, (d) 350 W, and (e) 450 W. The scale bar is 100 nm. (f) The size distribution of the Au particles obtained by analyzing several SEM images for each sample.

Figure 2

FIG. 3. TEM images of Au particles formed on ZnO seed layers deposited at the RF power of (a, c) 50 W and (b, d) 450 W after annealing up to 990 °C: (a, b) cross-sectional images and (c, d) plan-view images.

Figure 3

FIG. 4. SEM images of ZnO nanowires grown on ZnO seed layers deposited at (a) 50 W, (b) 250 W, and (c) 450 W. The scale bar is 1 μm. (d) The ZnO nanowire densities were estimated from the SEM images for each sample.

Figure 4

FIG. 5. (a) High resolution TEM image of a ZnO nanowire grown on ZnO seed layer deposited at a sputtering power of 450 W. (b) Selected area diffraction pattern along the zone axis of $\left[ {01\overline 1 0} \right]$, which clearly indicates the single crystalline growth of ZnO nanowire.

Figure 5

FIG. 6. X-ray diffraction (XRD) data obtained from ZnO nanowires grown on ZnO seed layers deposited at different RF powers (50, 150, 250, 350, and 450 W). Shown in the inset is XRD data obtained from the ZnO seed layers with an Au catalytic layer only (i.e., before the nanowires were grown).