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Templated grain growth and piezoelectric properties of 〈001〉-textured PIN–PMN–PT ceramics

Published online by Cambridge University Press:  27 July 2015

Dan-dan Wei
Affiliation:
Electronic Materials Research Laboratory & State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China
Qi-bin Yuan
Affiliation:
Electronic Materials Research Laboratory & State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China
Gao-qun Zhang
Affiliation:
Electronic Materials Research Laboratory & State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China
Hong Wang*
Affiliation:
Electronic Materials Research Laboratory & State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China
*
a) Address all correspondence to this author. e-mail: hwang@mail.xjtu.edu.cn

Abstract

The 〈001〉-textured 36Pb(In1/2Nb1/2)O3–30Pb(Mg1/3Nb2/3)O3–34PbTiO3 (36PIN–30PMN–34PT) ceramics were successfully prepared by the templated grain growth method using BaTiO3 (BT) templates with an average edge length of 10 μm and a thickness of about 0.5 μm. The highest Lotgering factor of 95% has been achieved for the textured ceramics with 5 wt% BT templates sintered at 1240 °C. The Curie temperature (T C) and dielectric constant (εr) of the textured 36PIN–30PMN–34PT ceramics were 225 °C and 2850, respectively. The piezoelectric constant d 33 of the textured samples was 780 pC/N and almost 2 times higher than that of random 36PIN–30PMN–34PT samples. The planar mode electromechanical coupling coefficient k p was 59% for the textured samples. Unipolar strain-field measurements for the textured ceramics exhibited 0.34% strain at 4 kV/mm.

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Articles
Copyright
Copyright © Materials Research Society 2015 
Figure 0

FIG. 1. (a) XRD pattern and (b) SEM image of the BT templates.

Figure 1

FIG. 2. (a) XRD pattern and (b) SEM image of the 36PIN–30PMN–34PT matrix powders.

Figure 2

FIG. 3. (a) XRD patterns of the random and textured 36PIN–30PMN–34PT ceramics with 3, 5, and 10 wt% BT templates, (b) Lotgering factor as a function of BT templates content.

Figure 3

FIG. 4. SEM image of the samples with 5 wt% BT templates after heating at 600 °C for 4 h.

Figure 4

FIG. 5. SEM images of (a) random samples, (b) samples with 3 wt% templates, (c) samples with 5 wt% templates, and (d) samples with 10 wt% templates sintered at 1240 °C for 5 h.

Figure 5

FIG. 6. The temperature dependence of the dielectric constant of the random and textured 36PIN–30PMN–34PT samples.

Figure 6

FIG. 7. (a) The hysteresis loops of the random and textured 36PIN–30PMN–34PT ceramics, (b) the remnant polarization as a function of BT templates content.

Figure 7

FIG. 8. Unipolar strain-field curves of the random and textured (with 5 wt% BT) PIN–PMN–PT ceramics.

Figure 8

FIG. 9. Variations in d33, kp, Np, and Qm of the ceramics as a function of BT templates content.

Figure 9

TABLE I. Piezoelectric and dielectric properties of the random and textured PIN–PMN–PT ceramics.