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Defects and doping and their role in functionalizing graphene

Published online by Cambridge University Press:  23 November 2012

Sokrates T. Pantelides
Affiliation:
Vanderbilt University and Oak Ridge National Laboratory; pantelides@vanderbilt.edu
Yevgeniy Puzyrev
Affiliation:
Department of Physics and Astronomy, Vanderbilt University; yevgeniy.s.puzyrev@vanderbilt.edu
Leonidas Tsetseris
Affiliation:
School of Applied Mathematical and Physical Sciences, National Technical University, Greece; leont@mail.ntua.gr
Bin Wang
Affiliation:
Department of Physics and Astronomy, Vanderbilt University; bin.wang@vanderbilt.edu

Abstract

Graphene is a two-dimensional material with unique properties, such as superb mechanical strength and carrier mobility. Similarly to semiconductors, however, graphene is not very useful for applications in its pristine form; rather, it must be “functionalized” through judicious manipulation of defects, impurities, and adsorbates. In this article, we provide an overview of the intrinsic defects in graphene, such as vacancies, interstitials, and line defects, and their potential role in transport and other properties. We also discuss impurities and adsorbates that can act as dopants to enhance carrier densities, controlling n- and p-type conduction for transistor applications, and can serve as reactive sites for catalytic and sensor applications. Although functionalization holds significant promise, realization of that potential remains an open pursuit.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2012
Figure 0

Figure 1. Defects imaged by transmission electron microscopy (TEM). Normal six-membered rings are highlighted in blue, five-membered rings in green, and rings with seven or more members in red. (a) Stone–Wales defect, (b) more complex Stone–Wales-like defect, (c) single vacancy. The scale bar in (b) represents 2 Å. Reproduced with permission from Reference 1. ©2008, American Chemical Society.

Figure 1

Figure 2. (a) Schematic diagram of a vacancy in graphene; (b) the calculated electron density (e/Å3) around the vacancy; and (c) the spin density (e/Å3), which reflects the electron density of the dangling-bond state on the lower two-fold-coordinated atom. Parts (a)–(c) reproduced with permission from Reference 5. ©2004, Institute of Physics Publishing. (d) Atomically resolved scanning tunneling microscopy (STM) image of a vacancy in graphite in a field of normally bonded atoms. Part (d) reproduced with permission from Reference 8. ©2008, American Physical Society.

Figure 2

Figure 3. Simulated self-healing of hillocks on graphene: (a) initial configuration with a defect complex of three carbon interstitials in a capped-hillock formation, (c–d) protrusions containing three carbon interstitials, and (b) transition state for the transformation from structure (a) to structure (c). The final three-carbon-interstitial protrusion is mobile and can thus anneal out at graphene edges or adjacent materials. Reproduced with permission from Reference 12. ©2009, Elsevier.

Figure 3

Figure 4. Structures of grain boundaries in (a–b) zigzag-oriented and (c–d) armchair-oriented graphene sheets with varying tilt angles θ = (a) 5.5°, (b) 21.7°, (c) 15.8°, and (d) 28.7°. The heptagon–pentagon pairs constitute dislocation cores, denoted by “T” symbols whose stem represents the orientation of the added line of atoms. Parts (a)–(d) reproduced with permission from Reference 18. ©2010, American Association for the Advancement of Science. (e) Schematic diagram of a line defect in graphene, including an expanded view of the atomic structure, and (f) atomically resolved STM image of the line defect shown in panel (e). Parts (e) and (f) reproduced with permission from Reference 19. ©2011, American Physical Society.

Figure 4

Figure 5. First-principles calculations suggest that electron transport through grain boundaries in graphene falls into two classes, depending on the orientations of the two grains relative to the boundary. (a) Atomic structure of a class I grain boundary (θ = 21.8°). (b) Transmission probability T through this class I grain boundary as a function of transverse momentum k‖ and energy E, showing states with matching k‖ values on both sides, even at the Dirac point. (c) Zero-bias total transmission per unit length through the class I grain boundary as a function of energy (solid line) compared to that of ideal graphene (dashed line). (d) Atomic structure of a class-II grain boundary (θ = 30°). (e–f) Corresponding k‖-resolved and total carrier transmissions through the class II grain boundary, showing allowed transitions only at higher energy. Reproduced with permission from Reference 24. ©2010, Nature Publishing Group.

Figure 5

Figure 6. (a) Change in charge carrier density, Δn, in single-layer graphene exposed to different concentrations, C, of NO2. Insets show the gated Hall-bar structure (top; width = 1 μm) and the data used to deduce the density (bottom). VG, gate voltage; ρ, longitudinal resistivity; ρxy, transverse resistivity. (b) Changes in resistivity, Δρ, caused by exposing graphene to various gases diluted in concentration to 1 ppm. The positive (negative) sign of a change indicates electron (hole) doping. Region I, in a vacuum before its exposure; II, exposure to a diluted chemical; III, evacuation of the experimental setup; and IV, annealing at 150°C. Reproduced with permission from Reference 33. ©2007, Nature Publishing Group.

Figure 6

Figure 7. Z-contrast TEM image, in which brightness differences reflect differences in atomic number, of a real graphene edge, showing decoration by silicon atoms. Adapted from Reference 37.

Figure 7

Figure 8. (a–b) Current–voltage characteristics for graphene-based field-effect transistors (FETs). The as-grown p-channel transistor behavior (red, VGS = –40 V, –37 V, –34 V, –31 V, and –28 V from top to bottom) is converted to n-channel behavior (blue, VGS = 40 V, 35 V, 30 V, 25 V, and 20 V from top to bottom) after electrothermal annealing (e-anneal) in ammonia. (c–d) Theoretical density of states (DOS) data for (c) oxygen-related and (d) nitrogen-related impurity configurations (insets) at the edge of a graphene nanoribbon. The calculated Fermi levels below and above the gap could account for the p-type and n-type doping in panels (a) and (b), respectively. The red dashed curve in (c) is the DOS projected onto the carbon backbone. Reproduced with permission from Reference 41. ©2009, American Association for the Advancement of Science.

Figure 8

Figure 9. (a) Z-contrast image of two adjacent substitutional silicon atoms in monolayer graphene. (b) Plasmon map obtained from electron energy-loss spectroscopy data in the 11–18 eV range. Reproduced with permission from Reference 70. ©2012, Nature Publishing Group.