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Visible Raman spectroscopy of carbon films synthesized by ion-plasma sputtering of graphite

Published online by Cambridge University Press:  13 January 2016

Alexander P. Ryaguzov*
Affiliation:
National Nanotechnological Laboratory Open Type, Al-Farabi KazNU, Almaty 050012, Kazakhstan; and Department of Molecular Physics, National Research Nuclear University MEPhI, Moscow 115409, Russia
Gaziz A. Yermekov
Affiliation:
National Nanotechnological Laboratory Open Type, Al-Farabi KazNU, Almaty 050012, Kazakhstan
Timur E. Nurmamytov
Affiliation:
National Nanotechnological Laboratory Open Type, Al-Farabi KazNU, Almaty 050012, Kazakhstan
Renata R. Nemkayeva*
Affiliation:
National Nanotechnological Laboratory Open Type, Al-Farabi KazNU, Almaty 050012, Kazakhstan; and Laboratory of engineering profile, Al-Farabi KazNU, Almaty 050040, Kazakhstan
Nazim R. Guseinov
Affiliation:
National Nanotechnological Laboratory Open Type, Al-Farabi KazNU, Almaty 050012, Kazakhstan
Rustam K. Aliaskarov
Affiliation:
Laboratory of engineering profile, Al-Farabi KazNU, Almaty 050040, Kazakhstan
*
a) Address all correspondence to these authors. e-mail: ryaguzov_a@mail.ru, quasisensus@mail.ru
a) Address all correspondence to these authors. e-mail: ryaguzov_a@mail.ru, quasisensus@mail.ru

Abstract

The article discusses the structure and properties of noncrystalline carbon films synthesized by ion-plasma sputtering of a graphite target in an argon atmosphere at direct current. Analysis of the molecular structure of carbon films was performed using Raman spectroscopy and dependence of the structure of synthesized films on the synthesis temperature and substrate material was revealed. Besides the main G peak possesses the values in a broad frequency range from 1500 to 1575 cm−1. The evolution of molecular structure peculiarities of synthesized carbon films depending on the synthesis conditions was clearly shown using the numerical methods of the Raman spectra decomposition. Studies of the optical spectra showed that the band gap of synthesized films varies from 0.78 to 1.67 eV and with increasing optical band gap, the value of G peak position decreases under laser excitation of 2.62 and 1.96 eV.

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Copyright © Materials Research Society 2016 
Figure 0

FIG. 1. Raman spectra of carbon films prepared at different substrate temperatures: (a) a quartz substrate; (b) a silicon substrate.

Figure 1

FIG. 2. Dependence of the G peak position on the synthesis temperature of diamond-like carbon (DLC) films on Si and quartz substrates.

Figure 2

FIG. 3. Raman spectra of carbon films synthesized on SiO2 and Si at different temperatures of synthesis using the Gauss decomposition method. (a) SiO2 substrate Tsub=50°C, (b) Si substrate Tsub=50°C, (c) SiO2 substrate Tsub=150°C, (d) Si substrate Tsub=150°C, (e) SiO2 substrate Tsub=250°C, (f) Si substrate Tsub=250°C.

Figure 3

TABLE I. The values of the wave number q (cm−1), the half-width and height of Gaussian peaks corresponding to the three synthesis temperatures Tsub (°C) of the carbon films on quartz and silicon substrate.

Figure 4

FIG. 4. Raman spectra of amorphous DLC films prepared at different temperatures on substrates: (a) quartz; (b) silicon.

Figure 5

TABLE II. Values of wave numbers (q, cm−1) of D and G peaks at various synthesis temperatures (Tsub, °C) of carbon films on quartz and silicon substrates.

Figure 6

FIG. 5. Dependence of the optical band gap on the synthesis temperature of carbon films.

Figure 7

FIG. 6. Dependence of G peak position on the band gap value in carbon films.