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Engineering and modifying two-dimensional materials by electron beams

Published online by Cambridge University Press:  08 September 2017

Xiaoxu Zhao
Affiliation:
Graduate School for Integrative Sciences and Engineering, National University of Singapore, Singapore; xiaoxu_zhao@u.nus.edu
Jani Kotakoski
Affiliation:
Faculty of Physics, University of Vienna, Austria; jani.kotakoski@univie.ac.at
Jannik C. Meyer
Affiliation:
Faculty of Physics, University of Vienna, Austria; jannik.meyer@univie.ac.at
Eli Sutter
Affiliation:
Department of Mechanical and Materials Engineering, University of Nebraska–Lincoln, USA; esutter@unl.edu
Peter Sutter
Affiliation:
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln, USA; psutter@unl.edu
Arkady V. Krasheninnikov
Affiliation:
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Germany; Department of Applied Physics, Aalto University, Finland; a.krasheninnikov@hzdr.de
Ute Kaiser
Affiliation:
Central Facility of Electron Microscopy, Ulm University, Germany; ute.kaiser@uni-ulm.de
Wu Zhou
Affiliation:
Electron Microscopy Laboratory, School of Physical Sciences, University of Chinese Academy of Sciences, China; wuzhou@ucas.ac.cn

Abstract

Electron-beam (e-beam) irradiation damage is often regarded as a severe limitation to atomic-scale study of two-dimensional (2D) materials using electron microscopy techniques. However, energy transferred from the e-beam can also provide a way to modify 2D materials via defect engineering when the interaction of the beam with the sample is precisely controlled. In this article, we discuss the atomic geometry, formation mechanism, and properties of several types of structural defects, ranging from zero-dimensional point defects to extended domains, induced by an e-beam in a few representative 2D materials, including graphene, hexagonal boron nitride, transition-metal dichalcogenides, and phosphorene. We show that atomic as well as line defects and even novel nanostructures can be created and manipulated in 2D materials by an e-beam in a controllable manner. Phase transitions can also be induced. The e-beam in a (scanning) transmission electron microscope not only resolves the intrinsic atomic structure of materials with defects, but also provides new opportunities to modify the structure with subnanometer precision.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2017 
Figure 0

Figure 1. Point defects in 2D materials. (a–f) Scanning transmission electron microscope annular dark-field images of VS, VS2, MoS2, VMoS3, VMoS6, and S2Mo type of point defects in a MoS2 monolayer, respectively.10 Scale bars are 0.5 nm. (g) Formation energies of different point defects in a MoS2 monolayer as a function of the chemical potential of sulfur (μS).25 (h) Histograms of the densities of various point defects in MoS2 monolayers prepared by physical vapor deposition (PVD), chemical vapor deposition (CVD), and mechanical exfoliation (ME). Reprinted with permission from Reference 11. © 2015 Macmillan Publishers Ltd.

Figure 1

Figure 2. Scanning transmission electron microscope annular dark-field images showing controlled relocation of a Si impurity in graphene. In each step, the e-beam is parked on the position marked by the white dot, until the Si (appearing in panels with bright contrast within the graphene lattice) and the C atom exchange places (dashed lines show where the impurity has moved further than intended). Scale bar = 0.5 nm.57

Figure 2

Figure 3. Examples of line defects in 2D transition-metal dichalcogenides. Top panels show the high-resolution or scanning transmission electron microscope (HRTEM or STEM) images, and the lower panels represent the corresponding atomic structures (Mo/W, green; S/Se, yellow or brown). (a) HRTEM image of monolayer MoS2 with a staggered double vacancy line (top panel) and the corresponding atomic structure (bottom panel).28 (b–d) Three types of mirror twin-boundary (MTB) structures. (b) 4|4P MTB in MoSe2 (HRTEM image, Mo is blue in the overlaid structure),40 (c) 4|4E MTB in MoS2 (STEM annular dark-field [ADF] image, overlaid structure shows Mo, purple, and a lower layer of S, white),10 (d) 55|8 MTB in WSe2 (STEM ADF image).60 The triangles in the lower panels highlight the registry of the lattice at the two sides of the MTB. The dashed horizontal lines highlight strain in the perpendicular direction when the lattices are aligned at the top.

Figure 3

Figure 4. Electron-beam-induced transformations of 2D and layered crystals. (a) Scanning transmission electron microscope annular dark-field (STEM ADF) images of reversible conversion between 2H and 1T phases of MoS2 via an intermediate α phase (white arrows indicate Re dopant atoms). Reprinted with permission from Reference 82. © 2014 Macmillan Publishers Ltd. (b) STEM ADF images of reorientation of W-atom zigzag chains in the distorted 1T phase of WS2 (ZT phase, highlighted in purple; DT phase, highlighted in yellow). Scale bars = 1 nm. Reprinted with permission from Reference 83. © 2016 American Chemical Society. (c) High-resolution transmission electron microscope (HRTEM) images showing conversion of crystalline graphene to an amorphous sp2 carbon membrane.50 (d) HRTEM images showing knock-on-induced transformation from few-layer SnS2 to SnS.32 Inset shows enlarged images. Corresponding diffraction images are shown in lower panel.

Figure 4

Figure 5. Novel nanostructures created in 2D materials under electron irradiation. (a–c) Atomic chains derived from (a) graphene via scanning transmission electron microscopy (STEM), (b) hexagonal boron nitride,36 and (c) phosphorene via high-resolution transmission electron microscope (ac, armchair direction). (a) Reprinted with permission from Reference 35. © 2017 American Chemical Society. (c) Reprinted with permission from Reference 8. © 2017 Springer. (d) Patterning of MoSe nanowires in a MoSe2 monolayer.38 STEM annular dark field (STEM ADF) images of individual MoS, MoSe, and WSe nanowires, respectively.38 (e) STEM ADF images of MoSe nanowires with a rotational twist, axial kink, branching of the nanowire, and x-junction, respectively, together with the atomic structural model of a single MX nanowire (M = Mo or W, X = S or Se).39 (f) STEM ADF image of a CuO monolayer nanosheet on a graphene substrate, and theoretical model of a CuO sheet on a graphene step edge. (g) A CuO monolayer suspended in a graphene nanopore, and the corresponding theoretical model (Cu, blue; oxygen, red).43