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Thermal reduction of graphene oxide: How temperature influences purity

Published online by Cambridge University Press:  27 September 2018

Iman Sengupta
Affiliation:
Department of Chemical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India
Samarshi Chakraborty
Affiliation:
Department of Chemical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India
Monikangkana Talukdar
Affiliation:
Department of Chemical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India
Surjya K. Pal
Affiliation:
Department of Mechanical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India
Sudipto Chakraborty*
Affiliation:
Department of Chemical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal 721302, India
*
a)Address all correspondence to this author. e-mail: sc@che.iitkgp.ernet.in

Abstract

Among various methods used for the reduction of graphene oxide (GO) into a purer form of graphene, the thermal reduction method provides a simpler, safer, and economic alternative, compared to other techniques. Thermal reduction of GO causes significant weight loss and volume expansion of the material. Current work investigates the onset temperature where reduction in terms of exfoliation takes place, which is determined to be 325 °C at standard atmospheric pressure. Reduction temperature plays the most crucial role as it controls the quality of reduced graphene oxide in terms of weight percentage of carbon and lattice defect. The study leads to achieving highest content with a minimum defect in the graphene lattice at the optimum temperature, which is found to be 350 °C at standard atmospheric pressure. The thermal reduction process has been analyzed with the help of Fourier transform infrared spectroscopy, thermogravimetric analysis, and thermal degradation kinetics. From thermal degradation kinetics of GO, the rate of reaction has been found to be independent of concentration and is a sole function of temperature.

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Article
Copyright
Copyright © Materials Research Society 2018 
Figure 0

FIG. 1. Raman spectra of graphite, GO, and rGO (reduction temperature 300, 325, 350, 400, and 450 °C).

Figure 1

FIG. 2. XRD analysis of GO and rGO specimens.

Figure 2

TABLE I. Crystallite size, lattice planes, and d-spacing values obtained by XRD analysis.

Figure 3

FIG. 3. TEM images of (a) GO, (b) rGO (325 °C), (c) rGO (350 °C), and (d) rGO (450 °C).

Figure 4

FIG. 4. FTIR spectra of GO and rGO specimens, reduced at different temperatures.

Figure 5

FIG. 5. XPS spectra of C1s of (a) GO, (b) rGO 350 °C; O1s of (c) GO and (d) rGO 350 °C.

Figure 6

FIG. 6. FESEM images of (a) pure graphite (b) GO, and rGO heated at (c) 300 °C, (d) 305 °C, (e) 310 °C, (f) 315 °C, (g) 320 °C, (h) 325 °C, (i) 350 °C, (j) 400 °C, and (k) 450 °C.

Figure 7

FIG. 7. Specific surface area of GO and rGO specimens.

Figure 8

FIG. 8. Carbon content of GO and rGO of different reduction temperatures determined by CHNS elemental analysis.

Figure 9

FIG. 9. TGA of GO and rGO reduced at 350 °C.

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