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Synthesis and texturization processes of (super)-hydrophobic fluorinated surfaces by atmospheric plasma

Published online by Cambridge University Press:  02 October 2015

J. Hubert
Affiliation:
Faculté des Sciences, Service de Chimie Analytique et de Chimie des Interfaces, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
J. Mertens
Affiliation:
Faculté des Sciences, Service de Chimie Analytique et de Chimie des Interfaces, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
T. Dufour
Affiliation:
Faculté des Sciences, Service de Chimie Analytique et de Chimie des Interfaces, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
N. Vandencasteele
Affiliation:
Faculté des Sciences, Service de Chimie Analytique et de Chimie des Interfaces, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
F. Reniers*
Affiliation:
Faculté des Sciences, Service de Chimie Analytique et de Chimie des Interfaces, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
P. Viville
Affiliation:
Service de Chimie des Matériaux Nouveaux, Université de Mons-UMONS/Materia Nova, 20 Place du Parc, 7000 Mons, Belgium
R. Lazzaroni
Affiliation:
Service de Chimie des Matériaux Nouveaux, Université de Mons-UMONS/Materia Nova, 20 Place du Parc, 7000 Mons, Belgium
M. Raes
Affiliation:
Department of Metallurgy, Electrochemistry and Materials Science (SURF), Vrije Universiteit Brussel (VUB), Pleinlaan 2, B-1050 Brussel, Belgium
H. Terryn
Affiliation:
Department of Metallurgy, Electrochemistry and Materials Science (SURF), Vrije Universiteit Brussel (VUB), Pleinlaan 2, B-1050 Brussel, Belgium
*
a) Address all correspondence to this author. e-mail: freniers@ulb.ac.be

Abstract

The synthesis and texturization processes of fluorinated surfaces by means of atmospheric plasma are investigated and presented through an integrated study of both the plasma phase and the resulting material surface. Three methods enhancing the surface hydrophobicity up to the production of super-hydrophobic surfaces are evaluated: (i) the modification of a polytetrafluoroethylene (PTFE) surface, (ii) the plasma deposition of fluorinated coatings and (iii) the incorporation of nanoparticles into those fluorinated films. In all the approaches, the nature of the plasma gas appears to be a crucial parameter for the desired property. Although a higher etching of the PTFE surface can be obtained with a pure helium plasma, the texturization can only be created if O2 is added to the plasma, which simultaneously decreases the total etching. The deposition of Cx Fy films by a dielectric barrier discharge leads to hydrophobic coatings with water contact angles (WCAs) of 115°, but only the filamentary argon discharge induces higher WCAs. Finally, nanoparticles were deposited under the fluorinated layer to increase the surface roughness and therefore produce super-hydrophobic hybrid coatings characterized by the nonadherence of the water droplet at the surface.

Information

Type
Invited Feature Papers
Copyright
Copyright © Materials Research Society 2015 
Figure 0

FIG. 1. Structures of the two liquid precursors C6F12 and C6F14 and the two C6F14 isomers.

Figure 1

FIG. 2. Advancing WCAs of untreated PTFE and He and He–O2 plasma-treated PTFE, with the associated pictures of the static WCA. (P = 90 W, Ls = 10 mm, vs = 25 mm/s, gs = 500 µm, Ns = 1000, Φ(He) = 15 L/min, Φ(O2) = 0 and 100 mL/min).

Figure 2

FIG. 3. HR C1s spectra of untreated PTFE and He and He–O2 plasma-treated PTFE. (Ls = 10 mm, vs = 25 mm/s, gs = 500 µm, Ns = 1000, Φ(He) = 15 L/min, Φ(O2) = 0 and 100 mL/min, P = 90 W).

Figure 3

FIG. 4. 5 × 5 µm2 AFM 3D images of a PTFE surface treated by (a) pure He plasma (RRMS 15 nm) and (b) He–O2 plasma (RRMS 58 nm), with a Z scale of 511 nm. (Ls = 10 mm, vs = 25 mm/s, gs = 500 µm, Ns = 1000, Φ(He) = 15 L/min, Φ(O2) = 0 and 100 mL/min, P = 90 W).

Figure 4

FIG. 5. (a) Relative mass losses of PTFE as a function of the oxygen flow rate and (b) relative surface composition of the fluorinated fragments ejected from the PTFE on the aluminum foil. (Ls = 10 mm, vs = 25 mm/s, gs = 1 mm, Ns = 1000, Φ(He) = 15 L/min, P = 90 W).

Figure 5

FIG. 6. (a) Transmission rate of He 23S at 388.9 nm and (b) optical emission intensity of O (844.6 nm), O2+ (525 nm) and N2+ (391 nm) in the He–O2 postdischarge (gs = 1 mm, Φ(He) = 15 L/min, P = 120 W).

Figure 6

FIG. 7. Scheme of the two possible etching processes. In a pure helium plasma, the most important fragment produced is CF2.

Figure 7

FIG. 8. Intensity of the (a) CF3+, C2F5+, C3F5+ and C3F7+ and (b) CO2+, COF+, COF2+ fragments generated during the atmospheric pressure PECVD of C6F14 as a function of time, in argon (____ full curves) and helium (- - - dashed curves). (0.2 L/min C6F14-carrier gas, 5 L/min carrier gas total, 50 W).

Figure 8

FIG. 9. Scheme of the possible fragmentation of C6F14 (left) in the mass spectrometer and (right) in the plasma, followed by the mass spectrometer (CxFy+ and CwFz+ assuming to be CF3+, C3F7+ and C3F5+ according to MS results).

Figure 9

TABLE I. Surface composition of pp-C6F12 films as a function of the carrier gas (0.2 L/min C6F12-carrier gas, 5 L/min carrier gas total, 50 W).

Figure 10

FIG. 10. Advancing WCA and roughness RMS of the silicon wafer substrate and the pp films. Illustration of the drop behavior of (left) Ar–C6F14 and (right) He–C6F12 coatings. (0.2 L/min precursor-carrier gas, 5 L/min carrier gas total, 50 W).

Figure 11

FIG. 11. 5 × 5 µm2 AFM images of (a) He–C6F12, (b) Ar–C6F12 and (c) Ar–C6F14 pp films. (0.2 L/min C6F14-carrier gas, 5 L/min carrier gas total, 50 W, thickness of about 300 nm).

Figure 12

FIG. 12. Advancing WCA of the pp films without nanoparticles (light gray) and with nanoparticles (red) for an identical deposition time of 2 min (left) and a similar thickness of about 200 nm (right). (0.2 L/min C6F12-carrier gas, 5 L/min carrier gas total, 50 W).

Figure 13

FIG. 13. HR C1s spectra of pp-C6F12 films in argon with SiO2 nanoparticles (red curve) and without SiO2 nanoparticles (black dashed curve). (0.2 L/min C6F12-carrier gas, 5 L/min carrier gas total, 50 W).

Figure 14

FIG. 14. SEM images (magnification 5000) and summary of the effect of the nanoparticles on the properties of coatings synthesized from argon and helium plasmas.

Figure 15

FIG. 15. Advancing WCAs and roughness RMS as a function of the SiO2 nanoparticles concentration for C6F12 coatings (Ar–C6F12 50 W, 2 min).