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Fatal mistake, awful mistake, or extreme mistake? Frequency effects on off-line/on-line collocational processing*

Published online by Cambridge University Press:  29 October 2014

SUHAD SONBUL*
Affiliation:
Umm Al-Qura University University of Nottingham
*
Address for correspondence: Suhad Sonbul, P.O.Box: 10424 Makkah (zip code: 21955)Saudi Arabiasssonbul@uqu.edu.sa
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Abstract

This study explored whether native speakers of English and non-natives are sensitive to corpus-derived frequency of synonymous adjective-noun collocations (e.g., fatal mistake, awful mistake, and extreme mistake) and whether level of proficiency can influence this sensitivity. Both off-line (typicality rating task) and on-line (eye-movement) measures were employed. Off-line results showed that both natives and non-natives were sensitive to collocational frequency with clearer effects for non-natives as their proficiency increased. On-line, however, proficiency had no effect on sensitivity to frequency; both natives and non-natives showed early sensitivity to collocational frequency (first pass reading time). This on-line sensitivity disappeared later in processing for both groups (total reading time and fixation count). Results are discussed in light of usage-based theories of language acquisition and processing.

Information

Type
Research Article
Copyright
Copyright © Cambridge University Press 2014 
Figure 0

Table 1. Summary of the Continuous Variables.

Figure 1

Table 2. Mean (SE) on-line reading times and fixations counts for both natives and non-natives under various collocational frequency quantiles.

Figure 2

Table 3. Summary of the Best Fit LME Model for Variables Predicting Log First Pass Reading Time (N = 1611, R2 = 0.47).

Figure 3

Figure 1. Interaction between VLT score and Tiral Number for the on-line first pass reading time measure.

Figure 4

Table 4. Summary of the Best Fit LME Model for Variables Predicting Log Total Reading Time (N = 1601, R2 = 0.58).

Figure 5

Table 5. Summary of the Best Fit LME Model for Variables Predicting Log Fixation Count (N = 1748, R2 = 0.58).

Figure 6

Table 6. Mean (SD) off-line rating scores for both natives and non-natives under various collocational frequency quantiles.

Figure 7

Table 7. Summary of the Best Fit LME Model for Variables Predicting Log Rating Score (N = 1793, R2 = 0.45).

Figure 8

Figure 2. Interaction between VLT score and log W1 frequency for the off-line measure.

Figure 9

Figure 3. Interaction between VLT score and log collocational frequency for the off-line measure (Note: the first and second log collocational frequency quantiles are identical).

Figure 10

Appendix: Target Items