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In situ characterization methods for evaluating microstructure formation and drying kinetics of solution-processed organic bulk-heterojunction films

Published online by Cambridge University Press:  26 May 2017

Nusret Sena Güldal*
Affiliation:
Materials for Energy Technology and Electronics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen 91058, Germany
Thaer Kassar
Affiliation:
Chair for Crystallography and Structural Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen 91058, Germany
Marvin Berlinghof
Affiliation:
Chair for Crystallography and Structural Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen 91058, Germany
Tobias Unruh
Affiliation:
Chair for Crystallography and Structural Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen 91058, Germany
Christoph J. Brabec
Affiliation:
Materials for Energy Technology and Electronics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen 91058, Germany; and Bavarian Center for Applied Energy Research (ZAE Bayern), Erlangen 91058, Germany
*
a) Address all correspondence to this author. e-mail: nsenaguldal@gmail.com

Abstract

Recently, in situ characterization methods have attracted increasing attention, especially in organic photovoltaics (OPV) field, since they provide greater insight into the mechanism of film formation, thus help to identify optimized processing conditions used to process the most efficient organic bulk-heterojunction thin films. In combination with various powerful X-ray-based characterization methods, several studies observed the morphological changes under the influence of different processing conditions. In this review, we summarize the fundamentals and implementation of X-ray-based and optical characterization methods, utilized in in situ mode and introduce the reader a better overview of the information acquired from a given technique in terms of microstructure formation in OPV. While we give a chronological development of in situ characterization methods in the field of OPV, we discuss the interplay between thermodynamics of solutions and drying kinetics of different types of organic blends.

Information

Type
Invited Reviews
Copyright
Copyright © Materials Research Society 2017 
Figure 0

FIG. 1. Possible morphology formations presented for a BHJ active layer. Red lines represent the donor, while black circles represent the acceptor. The ideal morphology is presented at top left corner of the picture, while other sketches represent the non-ideal microstructure formation causing performance losses in organic solar cells, as indicated accordingly.

Figure 1

FIG. 2. Schematic for thin film interference on substrates with higher refractive indices (left). Exemplary reflectance spectrum of P3HT:PCBM drying from ODCB solution measured with white light reflectometry. Interference fringes are present after the absorption edge of P3HT. Reproduced from Ref. 49 with permission from RSC.

Figure 2

FIG. 3. Schematic picture of the geometry of grazing incidence small/wide angle X-ray scattering (GISAXS/GIWAXS) measurements. The scattered signal is collected using a 2D detector.

Figure 3

FIG. 4. (a) Specular reflectivity of F8BT:PFB blend with constructive and destructive interferences. The inset shows the drying curve calculated from this data. (b) In situ light scattering data, plotted over time and wavevector Q. The inset shows the peak wavevector behavior over time. Reproduced from Ref. 82 with permission from ACS.

Figure 4

FIG. 5. (a) Models used to replicate pristine PMMA layer and PS:PMMA layer dryings. For pristine layer, PMMA is modeled alone. For PS:PMMA, until 3.9 s, the model was established with 2 discrete layers on top of each other. After 3.9 s, the model was switched to 1 mixed layer. (b) Light scattering data of PS:PMMA. The inset shows some snapshots of the profiles. (c) Atomic force microscopy of the dried film of PS:PMMA. Reproduced from Ref. 84 with permission from Nature Publishing Group.

Figure 5

FIG. 6. Unprocessed stroboscopic optical reflectance images recorded during spin coating of PS:PI blend from o-xylene are shown on top. The corrected 2D Fourier transformed images are shown below each frame. The integrated Fourier transform for the entire drying process is shown at the bottom. Reproduced from Ref. 85 with permission from ACS.

Figure 6

FIG. 7. Evolution of P3HT [100] diffraction peak from (a) from P3HT:PCBM and (b) from P3HT:PNDIT solutions. (c) Evolution of PNDIT [100] diffraction peak from P3HT:PNDIT solution. (d) Drying process of P3HT:PCBM and P3HT:PNDIT represented schematically. Stage I: dissolved state, Stage II: nucleation and growth, Stage III: solvent swollen glass state, Stage IV: glassy state. Reproduced from Ref. 86 with permission from Wiley VCH.

Figure 7

FIG. 8. (a) The thickness of a P3HT:PCBM blend film as a function of time after casting determined using spectroscopic ellipsometry at different temperatures. (b) is the re-plot of the data for 30 °C after 10th second of drying. (c) is the out-of-plane cross sections X-ray intensity of P3HT [100] peak. (d) is the crystallinity data determined from (c). Reproduced from Ref. 92 with permission from RSC.

Figure 8

FIG. 9. (a) 2D diffraction pattern of P3HT:PCBM dried at 10, 25, 40 and 80 °C. (b) Mosaicity of P3HT plotted with respect to drying time. (c) Atomic force microscopy topography images of P3HT:PCBM dried at 10 and 40 °C. The images on the left and right are the samples without and with ODT treatment, respectively. Reproduced from Ref. 93 with permission from Wiley VCH.

Figure 9

FIG. 10. (a) 2D X-ray diffraction images of P3HT:PCBM drying plotted at certain time segments for samples with 2:1, 1:0.8 and 1:2 ratios. (b) Evolution of total integrated intensity of P3HT (100) Bragg peak (top) and mosaicity of P3HT crystals (bottom) which was calculated from the azimuthal integration of the first-order Bragg peak shown in inset. Reproduced from Ref. 94 with permission from ACS.

Figure 10

FIG. 11. (a) Binary phase diagram of P3HT solution in ODCB. (b) Binary phase diagram of PCBM solution in ODCB. (c) GIXD profile plots at increasing drying times indicating the emergence of the diffraction peaks of PCBM, P3HT (h00) Bragg peaks. (d) Scheme shows the stages of molecular arrangement during solvent evaporation with nucleation at the substrate or air interface. Purple squares are crystalline P3HT, and dots are PCBM molecules. Reproduced from Ref. 96 with permission from ACS.

Figure 11

FIG. 12. (a) The thickness versus time data plotted on a log–log scale for P3HT:PCBM films processed without additive and with different amounts of ODT and CN, as indicated accordingly. Graphical summary of film solidification for P3HT:PCBM films studied from solutions with (b) CB only, (c) CB + CN and (d) CB + ODT. Reproduced from Refs. 29 and 103 with permission from Wiley VCH.

Figure 12

FIG. 13. (a) Detecting liquid–liquid phase separation with time. Film thickness, normalized interference and light scattering of DPP5T:PC70BM in solvent mixtures is monitored during spin coating. The solvent is chloroform (blue squares) and chloroform with 5 vol% ODCB (red circles). Green arrows schematically indicate the thickness reconstruction from the measured interference signal. The dashed lines indicate the onset of scattering. (b) Bright-field TEM images of DPP5T:PC70BM blends spin coated from chloroform and chloroform + 3 vol% ODCB solutions. Reproduced from Ref. 55 with permission from Nature Publishing Group.

Figure 13

FIG. 14. Time evolution of DPP-TT-T:PCBM drying was measured by WLR (a), LS (b) & (d), PL (c) & (e). Figures (b) and (c) are additionally ‘zoomed out’ (i.e., plotted over longer time scale), which are presented at figures (d) and (e), respectively. Increasing amount of DIO hinders PCBM aggregation (i.e., lower LS signals) and the self-quenching mechanisms of DPP-TT-T (i.e., higher PL signals right after host solvent drying). Reproduced from Ref. 102 with permission from RSC.

Figure 14

FIG. 15. Schematic of the SAXS roll coater (left), with 3 examples of measurements on the right with different distances from the coating head, corresponding to 14 s (a), 23 s (b) and 1 h (c) drying time, respectively. The 1 h experiment was recorded ex situ by rewinding back the coated film after 1 h. Reproduced from Ref. 104 with permission from AIP Publishing.

Figure 15

FIG. 16. Film thickness (black) and absorbance at 700 nm (red) from in situ UV-Vis absorbance studies during spin-coating and blade-coating. Increase in red-shifted absorbance at 700 nm is indicative of aggregation. Reproduced from Ref. 23 with permission from RSC.

Figure 16

FIG. 17. Line cut profiles of (a) p-DTS(FBTTh2)2:PC71BM and (b) p-DTS(FBTTh2)2:PC71BM with 0.4 vol% DIO 2, 6, 9, 12, 15, 25, 30, 45, and 60 min after casting show that the structure is static 2 min after casting regardless of the solvent composition. In situ GIWAXS image plots of (c) p-DTS(FBTTh2)2:PC71BM show that a static structure forms ≈5 s into spin-casting, while image plots for (d) p-DTS(FBTTh2)2:PC71BM with 0.4 vol% DIO show that the initial formation of a metastable polymorph that gradually attenuates to a different final structure ≈25 s after casting that finishes growing ≈30 s after spin casting is complete. Reproduced from Ref. 25 with permission from Wiley VCH.