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Twin-mediated crystal growth

Published online by Cambridge University Press:  19 September 2016

Ashwin J. Shahani*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
Peter W. Voorhees
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
*
a) Address all correspondence to this author. e-mail: shahani@u.northwestern.edu

Abstract

The structure and origin of twin defects have been studied over the past half-century. Recently, there has been renewed interest in investigating the mechanisms by which twin defects facilitate the growth of bulk and nanoscale systems. This article reviews our understanding and experimental advances to unravel the complex role that twin defects play during crystal growth. The following topics are addressed: growth promotion at single and multiple, parallel and antiparallel twin boundaries; the role of {100} and {111} solid–liquid interfaces during crystallization; the application of realtime imaging to the study of crystal growth in the presence of twin defects; and suggested future research needed to shed light on the driving forces for twin-related phenomena. By providing a broad survey of the existing literature on twin-assisted crystal growth, we anticipate that our review will aid researchers in deciphering various growth forms that arise in materials processing applications.

Information

Type
Invited Feature Papers
Copyright
Copyright © Materials Research Society 2016 
Figure 0

FIG. 1. Twinning across length scales: (a) heavily twinned Si wafer; (b) eutectic Si flake in an Al–Si alloy, in which the lines in the flake interior are twins23; (c) singly-twinned, Au-catalyzed Ge nanowire, where the boxed region corresponds to a single grain oriented along {111}.12 Reprinted with permissions from (b) Springer23 and (c) American Chemical Society.12

Figure 1

FIG. 2. (a) Crystal with a single Σ3 {111} twin plane. The twin plane emerges from the crystal in three re-entrant corners measuring 141.1°. Nucleation occurs readily at these corners, leading to rapid growth in the $\left[ {2\bar 1\bar 1} \right]$, $\left[ {\bar 12\bar 1} \right]$, and $\left[ {\bar 1\bar 12} \right]$ directions.13 (b) The trigonal solid that results if the three corner sites are allowed to grow. Note that the 141.1° re-entrant grooves have vanished. Reprinted with permission from American Institute of Physics.13

Figure 2

FIG. 3. Idealized schematic of growth process of (a) crystal with two parallel twin planes, according to Wagner18 and Hamilton and Seidensticker.13 (b) Nucleation first occurs at the 141.1° re-entrant groove (type I). The initiated layer propagates to the second twin plane and forms a new corner measuring 109.5° (type II). (c) Nucleation then occurs at the type II corner, leading to the continuous propagation of the crystal in the 〈112〉 direction. While the broad {111} facets are shown to be stationary in (a–c), they do grow out, but at a much slower rate compared to the twinned interface. Reprinted with permission from American Institute of Physics.13

Figure 3

FIG. 4. Schematic drawings of (a) cross-twinning model of FCC crystal growth,17 wherein the twin lamellae B and D are non-parallel; (b) a fiveling, or 5-fold, cyclic twin with a 7.35° residual gap28; (c) construction of an icosahedron from 20 regular, twinned tetrahedra or four fivelings.31 Reprinted with permissions from (a–b) Springer28 and (c) Elsevier.31

Figure 4

FIG. 5. Schematic illustration of the cooperation between {100} and {111} interfaces, according to Ming and Sunagawa.15 (a) The upper half of the crystal (i.e., above the single twin) is bounded by three {100} surfaces while the lower half is bounded by {111}. (b) When the upper half of the crystal grows out, the three {100} surfaces disappear and three re-entrant corners measuring 70.5° are produced. Growth occurs at the re-entrant corners until (c) the {100} surfaces appear again on the faces of the lower half of the crystal. The {100} surfaces grow out, producing (d) re-entrant corners measuring 109.5°. Reprinted with permission from Elsevier.15

Figure 5

FIG. 6. Schematic of growth process of (a) crystal with two parallel twin planes, according to Jagannathan et al.35 Initially, the crystal surfaces have a {111}/{111}/{111} structure. (b) Layers accumulate at the 141.1° re-entrant groove, and their edges form a {100} lip in the middle crystal. The {100} face is assumed to grow at a lower rate than the {111}/{111} 141.1° re-entrant such that (c) the {100} face covers the middle crystal. Reprinted with permission from International Union of Crystallography.24

Figure 6

FIG. 7. Schematic of growth process of a crystal with two parallel twin planes, according to Lee et al.24 (a) Nucleation first occurs at the 141.1° re-entrant groove [see Fig. 3(b)]. (b) The nucleated layers accumulate, forming {100} edges [see Fig. 6(b)]. (c) 2D nucleation occurs on the {100} lip as well as on the re-entrant groove. During steady-state growth, the crystal surfaces have a {111}/{111}/{100}/{111} structure. Reprinted with permission from International Union of Crystallography.24

Figure 7

FIG. 8. Schematic of growth process of (a) crystal with two parallel twin planes (in red), according to Fujiwara et al.11 (b) Nucleation first occurs at the type I re-entrant groove [see Fig. 3(b)], where twin1 intersects the crystal surface. (c) A triangular corner measuring 60° at the tip is formed due to the rapid growth at the re-entrant groove. (d) The triangular corner propagates across twin2, leading to the formation of two new type I grooves centered on twin2. (e–g) Rapid growth occurs at the new type I corners, thereby regenerating the type I corners at twin1. This process from (a) through (g) occurs continuously such that the net growth direction is 〈112〉 (see Fig. 3). Reprinted with permission from American Physical Society.11

Figure 8

FIG. 9. Characterization of grain boundaries via 4D (i.e., space and time-resolved) x-ray tomography data.20 (a) Semi-transparent Si particle overlaid with surfaces of the grain boundaries. (b) Magnified view of the boxed region in (a). The angular relationships are consistent with {111} Σ3 (twin) boundaries. (c) Propagation of the doubly-twinned interface in (b) during growth. Five semi-transparent isochromes are plotted 600 s apart, together with points along the two twin boundaries (labeled I and II and colored in blue and green, respectively). The morphology of the twinned interface appears identical between time-steps, suggesting that the WHS mechanism is operant. Reprinted with permission from Nature Publishing Group.20

Figure 9

FIG. 10. Morphology of the twinned interface under different growth conditions: (a) nucleation rate $\dot N$ at the re-entrant groove is the same order of magnitude as lateral growth rate Vl of layers so initiated, (b) $\dot N > {V_{\rm{l}}}$, and (c) $\dot N \gg {V_{\rm{l}}}$. A continuum of twinned growth morphologies is attainable.

Figure 10

FIG. 11. (a) Optical microscope image of a directionally solidified Si sample; for the experimental conditions, see Ref. 56. (b) X-ray projection showing the solid–liquid interface during the growth process. The magnified image shows the presence of a grain boundary groove (outlined in black). (c) Laue diagram recorded in transmission mode at 1246 s after the onset of solidification. X-ray topographs of the circled $\left( {\bar 1\bar 12} \right)$ reflection at times (d) 180, (e) 420, (f) 900, and (g) 1246 s. Reprinted with permission from Elsevier.56