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Evolution of crystallographic texture during deformation of submicron grain size titanium

Published online by Cambridge University Press:  11 February 2011

N.P. Gurao
Affiliation:
Department of Materials Engineering, Indian Institute of Science, Bangalore, 560012, India
Satyam Suwas*
Affiliation:
Department of Materials Engineering, Indian Institute of Science, Bangalore, 560012, India
*
a)Address all correspondence to this author. e-mail: satyamsuwas@materials.iisc.ernet.in

Abstract

Evolution of deformation texture in commercially pure titanium with submicron grain size (SMG) was studied using x-ray diffraction (XRD) and electron back scatter diffraction (EBSD) methods. The material was deformed by rolling at room temperature. The deformation mechanism was found to be slip dominated with a pyramidal <c + a> slip system facilitating plastic deformation. No evidence of tensile or compressive twinning was detected, as generally seen in the case of titanium with conventional microcrystalline grain size. The absence of twinning and the propensity of the pyramidal <c + a> slip system in the SMG Ti is attributed to the lack of coordinated motion of zonal partial dislocations that leads to twinning.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

TABLE I. Chemical composition of the commercially pure titanium used in the present investigation.

Figure 1

FIG. 1. Inverse pole figure map and the (0002) pole figure of the starting SMG titanium sample.

Figure 2

FIG. 2. (a) (0002) pole figures and (b) φ2 = 0° and 30° sections of the ODF for SMG Ti samples rolled to a strain of (i) 0.10, (ii) 0.29, (iii) 0.69, (iv) 1.2, and (v) 2.3.

Figure 3

FIG. 3. Evolution of (a) volume fractions of different texture components and (b) texture index for the deformed samples.

Figure 4

TABLE II. Deformation texture components in rolling of titanium.9

Figure 5

FIG. 4. (a) Inverse pole figure map with boundaries >5° with pattern quality map, (b) misorientation distribution chart, and (c) variation of low angle and high angle grain boundaries (LAGB and HAGB) with increasing strain for the SMG titanium samples rolled to different reductions.

Figure 6

FIG. 5. (a) Bright field image (with diffraction pattern), (b) dark field image from the 90% rolled (ε = 2.3) SMG Ti sample, and (c) evolution of Vickers hardness with rolling reduction for SMG Ti.

Figure 7

FIG. 6. (a) Comparison of the φ1 = 0° section of the ODF for ε = 1.2 (70% rolled) microcrystalline and SMG titanium and (b) evolution of B and E components as seen in the φ1 = 0° section of the ODF with strain for SMG titanium.

Figure 8

FIG. 7. Evolution of the kernel average misorientation distribution for the SMG titanium samples with increasing rolling reduction.

Figure 9

TABLE III. Average KAM values for the SMG titanium samples with increasing rolling reduction.

Figure 10

FIG. 8. (a) Inverse pole figure map. (b) Blank map with boundaries and misorientation distribution plot for microcrystalline titanium sample deformed to ε = 0.3 showing conspicuous twinning. The black lines correspond to high angle grain boundaries (HAGB) while the green boundaries correspond to compressive twin and orange boundaries to tensile twin.

Figure 11

FIG. 9. Fraction of the twinned (daughter) grains corresponding to compressive and tensile twins in microcrystalline and SMG titanium samples.